SSBC 2020: Sclera Segmentation Benchmarking Competition in the mobile environment

M. Vitek, A. Das, Y. Pourcenoux, A. Missler, C. Paumier, S. Das, I. De Ghosh, D. R. Lucio, L. A. Zanlorensi, D. Menotti, F. Boutros, N. Damer, J. H. Grebe, A. Kuijper, J. Hu, Y. He, C. Wang, H. Liu, Y. Wang, Z. SunD. Osorio-Roig, C. Rathgeb, C. Busch, J. Tapia, A. Valenzuela, G. Zampoukis, L. Tsochatzidis, I. Pratikakis, S. Nathan, R. Suganya, V. Mehta, A. Dhall, K. Raja, G. Gupta, J. N. Khiarak, M. Akbari-Shahper, F. Jaryani, M. Asgari-Chenaghlu, R. Vyas, S. Dakshit, P. Peer, U. Pal, V. Struc

Research output: Chapter in Book/Report/Conference proceedingConference PaperOther

7 Citations (Scopus)


The paper presents a summary of the 2020 Sclera Segmentation Benchmarking Competition (SSBC), the 7th in the series of group benchmarking efforts centred around the problem of sclera segmentation. Different from previous editions, the goal of SSBC 2020 was to evaluate the performance of sclera-segmentation models on images captured with mobile devices. The competition was used as a platform to assess the sensitivity of existing models to i) differences in mobile devices used for image capture and ii) changes in the ambient acquisition conditions. 26 research groups registered for SSBC 2020, out of which 13 took part in the final round and submitted a total of 16 segmentation models for scoring. These included a wide variety of deep-learning solutions as well as one approach based on standard image processing techniques. Experiments were conducted with three recent datasets. Most of the segmentation models achieved relatively consistent performance across images captured with different mobile devices (with slight differences across devices), but struggled most with low-quality images captured in challenging ambient conditions, i.e., in an indoor environment and with poor lighting.

Original languageEnglish
Title of host publicationIJCB 2020 - IEEE/IAPR International Joint Conference on Biometrics
EditorsNalini Ratha, Richa Singh, Vitomir Struc
Place of PublicationPiscataway NJ USA
PublisherIEEE, Institute of Electrical and Electronics Engineers
Number of pages10
ISBN (Electronic)9781728191867
ISBN (Print)9781728191874
Publication statusPublished - 2020
EventInternational Joint Conference on Biometrics 2020 - Virtual, United States of America
Duration: 28 Sep 20201 Oct 2020 (Proceedings) (Website)


ConferenceInternational Joint Conference on Biometrics 2020
Abbreviated titleIJCB 2020
Country/TerritoryUnited States of America
Internet address

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