Spiral scanning X-ray fluorescence computed tomography

Martin D. de Jonge, Andrew M. Kingston, Nader Afshar, Jan Garrevoet, Robin Kirkham, Gary Ruben, Glenn R. Myers, Shane J. Latham, Daryl L. Howard, David J. Paterson, Christopher G. Ryan, Gawain McColl

Research output: Contribution to journalArticleResearchpeer-review

Abstract

Scannin X-ra fluorescence tomo ra h was once considered im ractical due to prohibitive measurement time requirements but is now common for investigating metal distributions within small systems. A recent look-ahead to the possibilities of 4th-generation synchrotron light sources [J. Synchrotron. Radiat. 21, 1031 (2014)] raised the possibility of a spiral-scanning measurement scheme where motion overheads are almost completely eliminated. Here we demonstrate the spiral scanning measurement and use Fourier ring correlation analysis to interrogate sources of resolution degradation. We develop an extension to the Fourier ring correlation formalism that enables the direct determination of the resolution from the measured sinogram data, greatly enhancing its power as a diagnostic tool for computed tomography.

Original languageEnglish
Pages (from-to)23424-23436
Number of pages13
JournalOptics Express
Volume25
Issue number19
DOIs
Publication statusPublished - 18 Sep 2017

Cite this

de Jonge, M. D., Kingston, A. M., Afshar, N., Garrevoet, J., Kirkham, R., Ruben, G., ... McColl, G. (2017). Spiral scanning X-ray fluorescence computed tomography. Optics Express, 25(19), 23424-23436. https://doi.org/10.1364/OE.25.023424
de Jonge, Martin D. ; Kingston, Andrew M. ; Afshar, Nader ; Garrevoet, Jan ; Kirkham, Robin ; Ruben, Gary ; Myers, Glenn R. ; Latham, Shane J. ; Howard, Daryl L. ; Paterson, David J. ; Ryan, Christopher G. ; McColl, Gawain. / Spiral scanning X-ray fluorescence computed tomography. In: Optics Express. 2017 ; Vol. 25, No. 19. pp. 23424-23436.
@article{db7d82098d4244dea14684febf428635,
title = "Spiral scanning X-ray fluorescence computed tomography",
abstract = "Scannin X-ra fluorescence tomo ra h was once considered im ractical due to prohibitive measurement time requirements but is now common for investigating metal distributions within small systems. A recent look-ahead to the possibilities of 4th-generation synchrotron light sources [J. Synchrotron. Radiat. 21, 1031 (2014)] raised the possibility of a spiral-scanning measurement scheme where motion overheads are almost completely eliminated. Here we demonstrate the spiral scanning measurement and use Fourier ring correlation analysis to interrogate sources of resolution degradation. We develop an extension to the Fourier ring correlation formalism that enables the direct determination of the resolution from the measured sinogram data, greatly enhancing its power as a diagnostic tool for computed tomography.",
author = "{de Jonge}, {Martin D.} and Kingston, {Andrew M.} and Nader Afshar and Jan Garrevoet and Robin Kirkham and Gary Ruben and Myers, {Glenn R.} and Latham, {Shane J.} and Howard, {Daryl L.} and Paterson, {David J.} and Ryan, {Christopher G.} and Gawain McColl",
year = "2017",
month = "9",
day = "18",
doi = "10.1364/OE.25.023424",
language = "English",
volume = "25",
pages = "23424--23436",
journal = "Optics Express",
issn = "1094-4087",
publisher = "Optical Society of America (OSA)",
number = "19",

}

de Jonge, MD, Kingston, AM, Afshar, N, Garrevoet, J, Kirkham, R, Ruben, G, Myers, GR, Latham, SJ, Howard, DL, Paterson, DJ, Ryan, CG & McColl, G 2017, 'Spiral scanning X-ray fluorescence computed tomography' Optics Express, vol. 25, no. 19, pp. 23424-23436. https://doi.org/10.1364/OE.25.023424

Spiral scanning X-ray fluorescence computed tomography. / de Jonge, Martin D.; Kingston, Andrew M.; Afshar, Nader; Garrevoet, Jan; Kirkham, Robin; Ruben, Gary; Myers, Glenn R.; Latham, Shane J.; Howard, Daryl L.; Paterson, David J.; Ryan, Christopher G.; McColl, Gawain.

In: Optics Express, Vol. 25, No. 19, 18.09.2017, p. 23424-23436.

Research output: Contribution to journalArticleResearchpeer-review

TY - JOUR

T1 - Spiral scanning X-ray fluorescence computed tomography

AU - de Jonge, Martin D.

AU - Kingston, Andrew M.

AU - Afshar, Nader

AU - Garrevoet, Jan

AU - Kirkham, Robin

AU - Ruben, Gary

AU - Myers, Glenn R.

AU - Latham, Shane J.

AU - Howard, Daryl L.

AU - Paterson, David J.

AU - Ryan, Christopher G.

AU - McColl, Gawain

PY - 2017/9/18

Y1 - 2017/9/18

N2 - Scannin X-ra fluorescence tomo ra h was once considered im ractical due to prohibitive measurement time requirements but is now common for investigating metal distributions within small systems. A recent look-ahead to the possibilities of 4th-generation synchrotron light sources [J. Synchrotron. Radiat. 21, 1031 (2014)] raised the possibility of a spiral-scanning measurement scheme where motion overheads are almost completely eliminated. Here we demonstrate the spiral scanning measurement and use Fourier ring correlation analysis to interrogate sources of resolution degradation. We develop an extension to the Fourier ring correlation formalism that enables the direct determination of the resolution from the measured sinogram data, greatly enhancing its power as a diagnostic tool for computed tomography.

AB - Scannin X-ra fluorescence tomo ra h was once considered im ractical due to prohibitive measurement time requirements but is now common for investigating metal distributions within small systems. A recent look-ahead to the possibilities of 4th-generation synchrotron light sources [J. Synchrotron. Radiat. 21, 1031 (2014)] raised the possibility of a spiral-scanning measurement scheme where motion overheads are almost completely eliminated. Here we demonstrate the spiral scanning measurement and use Fourier ring correlation analysis to interrogate sources of resolution degradation. We develop an extension to the Fourier ring correlation formalism that enables the direct determination of the resolution from the measured sinogram data, greatly enhancing its power as a diagnostic tool for computed tomography.

UR - http://www.scopus.com/inward/record.url?scp=85029906267&partnerID=8YFLogxK

U2 - 10.1364/OE.25.023424

DO - 10.1364/OE.25.023424

M3 - Article

VL - 25

SP - 23424

EP - 23436

JO - Optics Express

JF - Optics Express

SN - 1094-4087

IS - 19

ER -

de Jonge MD, Kingston AM, Afshar N, Garrevoet J, Kirkham R, Ruben G et al. Spiral scanning X-ray fluorescence computed tomography. Optics Express. 2017 Sep 18;25(19):23424-23436. https://doi.org/10.1364/OE.25.023424