Speckle-Based X-Ray Dark-Field Tomography of an Attenuating Object

S. J. Alloo, D. M. Paganin, K. S. Morgan, M. J. Kitchen, A. W. Stevenson, S. C. Mayo, H. T. Li, B. M. Kennedy, A. Maksimenko, J. Bowden, K. M. Pavlov

Research output: Chapter in Book/Report/Conference proceedingConference PaperResearch

3 Citations (Scopus)

Abstract

Spatial resolution in standard phase-contrast X-ray imaging is limited by the finite number and size of detector pixels. This limits the size of features that can be seen directly in projection images or tomographic reconstructions. Dark-field imaging allows information regarding such features to be obtained, as the reconstructed image is a measure of the position-dependent small-angle X-ray scattering of incident rays from the unresolved microstructure. In this paper we utilize an intrinsic speckle-tracking-based X-ray imaging technique to obtain the effective dark-field signal from a wood sample. This effective dark-field signal is extracted using a Fokker-Planck type formalism, which models the deformations of illuminating reference-beam speckles due to both coherent and diffusive scatter from the sample. We here assume that (a) small-angle scattering fans at the exit surface of the sample are rotationally symmetric, and (b) the object has both attenuating and refractive properties. The associated inverse problem, of extracting the effective dark-field signal, is numerically stabilised using a "weighted determinants"approach. Effective dark-field projection images are presented, as well as the dark-field tomographic reconstructions obtained using Fokker-Planck implicit speckle-tracking.

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
Subtitle of host publicationDevelopments in X-Ray Tomography XIII
EditorsBert Muller, Ge Wang
Place of PublicationWashington USA
PublisherSPIE - International Society for Optical Engineering
Number of pages13
Volume11840
ISBN (Electronic)9781510645196
ISBN (Print)9781510645189
DOIs
Publication statusPublished - 9 Sept 2021
EventDevelopments in X-Ray Tomography XIII 2021 - San Diego, United States of America
Duration: 1 Aug 20215 Aug 2021

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume11840
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceDevelopments in X-Ray Tomography XIII 2021
Country/TerritoryUnited States of America
CitySan Diego
Period1/08/215/08/21

Keywords

  • Computed tomography
  • Dark-field imaging
  • Phase-contrast imaging
  • Speckle-based x-ray imaging

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