Space charge profile measurement techniques: recent advances and future directions

R J John Fleming

    Research output: Contribution to journalArticleResearchpeer-review

    77 Citations (Scopus)
    Original languageEnglish
    Pages (from-to)967 - 978
    Number of pages12
    JournalIEEE Transactions on Dielectrics and Electrical Insulation
    Volume12
    Issue number5
    DOIs
    Publication statusPublished - 2005

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