Original language | English |
---|---|
Pages (from-to) | 967 - 978 |
Number of pages | 12 |
Journal | IEEE Transactions on Dielectrics and Electrical Insulation |
Volume | 12 |
Issue number | 5 |
DOIs | |
Publication status | Published - 2005 |
Space charge profile measurement techniques: recent advances and future directions
R J John Fleming
Research output: Contribution to journal › Article › Research › peer-review
88
Citations
(Scopus)