Software image alignment for X-ray microtomography with submicrometre resolution using a SEM-based X-ray microscope

Sheridan C Mayo, Peter Robert Miller, D Gao, J Sheffield-Parker

    Research output: Contribution to journalArticleResearchpeer-review

    33 Citations (Scopus)
    Original languageEnglish
    Pages (from-to)257 - 263
    Number of pages7
    JournalJournal of Microscopy
    Volume228
    Issue number3
    Publication statusPublished - 2007

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