Original language | English |
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Pages (from-to) | 257 - 263 |
Number of pages | 7 |
Journal | Journal of Microscopy |
Volume | 228 |
Issue number | 3 |
Publication status | Published - 2007 |
Software image alignment for X-ray microtomography with submicrometre resolution using a SEM-based X-ray microscope
Sheridan C Mayo, Peter Robert Miller, D Gao, J Sheffield-Parker
Research output: Contribution to journal › Article › Research › peer-review
33
Citations
(Scopus)