TY - JOUR
T1 - Simultaneous two-wavelength holographic interferometry ina superorbital expansion tube facility
AU - McIntyre, Timothy J.
AU - Wegener, Margaret J.
AU - Bishop, Alexis I.
AU - Rubinsztein-Dunlop, Halina
PY - 1997/11/1
Y1 - 1997/11/1
N2 - A new variation of holographic interferometry has been utilized to perform simultaneoustwo-wavelength measurements, allowing quantitative analysis of the heavy particle and electron densities in a superorbital facility. An air test gas accelerated to 12 km/s was passed over a cylindrical model, simulating reentry conditions encountered by a space vehicle on a superorbital mission. Laser beams with two different wavelengths have been overlapped, passed through the test section, and simultaneously recorded on a single holographic plate. Reconstruction of the hologram generated two separate interferograms at different angles from which the quantitative measurements were made. With this technique, a peak electron concentration of (5.5 ± 0.5) × 1023 m−3 was found behind a bow shock on a cylinder.
AB - A new variation of holographic interferometry has been utilized to perform simultaneoustwo-wavelength measurements, allowing quantitative analysis of the heavy particle and electron densities in a superorbital facility. An air test gas accelerated to 12 km/s was passed over a cylindrical model, simulating reentry conditions encountered by a space vehicle on a superorbital mission. Laser beams with two different wavelengths have been overlapped, passed through the test section, and simultaneously recorded on a single holographic plate. Reconstruction of the hologram generated two separate interferograms at different angles from which the quantitative measurements were made. With this technique, a peak electron concentration of (5.5 ± 0.5) × 1023 m−3 was found behind a bow shock on a cylinder.
UR - http://www.scopus.com/inward/record.url?scp=0001109938&partnerID=8YFLogxK
U2 - 10.1364/AO.36.008128
DO - 10.1364/AO.36.008128
M3 - Article
AN - SCOPUS:0001109938
SN - 0003-6935
VL - 36
SP - 8128
EP - 8134
JO - Applied Optics
JF - Applied Optics
IS - 31
ER -