Simultaneous soft X-ray transmission and emission microscopy

A. Gianoncelli, B. Kaulich, R. Alberti, T. Klatka, A. Longoni, A. de Marco, A. Marcello, M. Kiskinova

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Abstract

Novel low-energy X-ray fluorescence (LEXRF) system based on a multiple Si drift detector (SDD) configuration has been developed and implemented in the European TwinMic X-ray microspectroscopy station operating at the Italian synchrotron radiation facility ELETTRA. The setup, hosting up to eight large-area SDDs with specially adapted readout electronics, has demonstrated excellent performance for elemental analysis in the 280-2200 eV photon energy range, which covers the K and L edges of light elements, starting from C. The great advantage is the simultaneous acquisition of LEXRF, absorption and phase contrast maps, providing complementary information on elemental composition and morphology of specimen at submicrometer length scales.

Original languageEnglish
Pages (from-to)195-198
Number of pages4
JournalNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment
Volume608
Issue number1
DOIs
Publication statusPublished - 1 Sep 2009
Externally publishedYes

Keywords

  • Carbon edge
  • Soft X-ray microscopy
  • X-ray fluorescence

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