Simultaneous deconvolution and re-construction of primary and secondary overlapping peak clusters in comprehensive two-dimensional gas chromatography

In this study, simultaneous deconvolution and reconstruction of peak profiles in the first ((1)D) and second dimension ((2)D) of comprehensive two-dimensional (2D) gas chromatography (GC x GC) is achieved on the basis of the property of this new type of instrumental data. First, selective information, where only one component contributes to the peak elution window of a given modulation event, is employed for stepwise stripping of each (2)D peak with the help of pure components corresponding to that compound from the neighbouring modulations. Simulation based on an exponentially modified Gaussian (EMG) model aids this process, where the EMG represents the envelope of all (2)D peaks for that compound. The peak parameters can be restricted by knowledge of the pure modulated (2)D GC peaks derived from the same primary compound, since it is modulated into several fractions during the trapping and re-focusing process of the cryogenic modulation system according to the modulation period.