Simulations of multi-contrast X-ray imaging using near-field speckles

Marie Christine Zdora; Pierre Thibault; Julia Herzen; Franz Pfeiffer; Irene Zanette

doi:10.1063/1.4937510

Simulations of multi-contrast X-ray imaging using near-field speckles

Marie Christine Zdora, Pierre Thibault, Julia Herzen, Franz Pfeiffer, Irene Zanette

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research

1 Citation (Scopus)

Abstract

X-ray dark-field and phase-contrast imaging using near-field speckles is a novel technique that overcomes limitations inherent in conventional absorption X-ray imaging, i.e. poor contrast for features with similar density. Speckle-based imaging yields a wealth of information with a simple setup tolerant to polychromatic and divergent beams, and simple data acquisition and analysis procedures. Here, we present a simulation software used to model the image formation with the speckle-based technique, and we compare simulated results on a phantom sample with experimental synchrotron data. Thorough simulation of a speckle-based imaging experiment will help for better understanding and optimising the technique itself.

Original language	English
Title of host publication	XRM 2014
Subtitle of host publication	Proceedings of the 12th International Conference on X-Ray Microscopy
Editors	Martin D. de Jonge, David J. Paterson, Christopher G. Ryan
Publisher	American Institute of Physics
Number of pages	5
ISBN (Electronic)	9780735413436
DOIs	https://doi.org/10.1063/1.4937510
Publication status	Published - 28 Jan 2016
Externally published	Yes
Event	International Conference on X-ray Microscopy (XRM) 2014 - Melbourne Convention and Exhibition Centre, Melbourne, Australia Duration: 26 Oct 2014 → 31 Oct 2014 Conference number: 12th http://xrm2014.synchrotron.org.au/

Publication series

Name	AIP Conference Proceedings
Volume	1696
ISSN (Print)	0094-243X
ISSN (Electronic)	1551-7616

Conference

Conference	International Conference on X-ray Microscopy (XRM) 2014
Abbreviated title	XRM 2014
Country/Territory	Australia
City	Melbourne
Period	26/10/14 → 31/10/14
Internet address	http://xrm2014.synchrotron.org.au/

Keywords

dark-field imaging
near-field speckles
phase-contrast imaging
synchrotron radiation
wavefront simulations
X-ray microscopy

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10.1063/1.4937510Licence: Unspecified

Cite this

Zdora, M. C., Thibault, P., Herzen, J., Pfeiffer, F., & Zanette, I. (2016). Simulations of multi-contrast X-ray imaging using near-field speckles. In M. D. de Jonge, D. J. Paterson, & C. G. Ryan (Eds.), XRM 2014: Proceedings of the 12th International Conference on X-Ray Microscopy Article 020016 (AIP Conference Proceedings; Vol. 1696). American Institute of Physics. https://doi.org/10.1063/1.4937510

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title = "Simulations of multi-contrast X-ray imaging using near-field speckles",

abstract = "X-ray dark-field and phase-contrast imaging using near-field speckles is a novel technique that overcomes limitations inherent in conventional absorption X-ray imaging, i.e. poor contrast for features with similar density. Speckle-based imaging yields a wealth of information with a simple setup tolerant to polychromatic and divergent beams, and simple data acquisition and analysis procedures. Here, we present a simulation software used to model the image formation with the speckle-based technique, and we compare simulated results on a phantom sample with experimental synchrotron data. Thorough simulation of a speckle-based imaging experiment will help for better understanding and optimising the technique itself.",

keywords = "dark-field imaging, near-field speckles, phase-contrast imaging, synchrotron radiation, wavefront simulations, X-ray microscopy",

author = "Zdora, \{Marie Christine\} and Pierre Thibault and Julia Herzen and Franz Pfeiffer and Irene Zanette",

note = "Publisher Copyright: {\textcopyright} 2016 AIP Publishing LLC.; International Conference on X-ray Microscopy (XRM) 2014, XRM 2014 ; Conference date: 26-10-2014 Through 31-10-2014",

year = "2016",

month = jan,

day = "28",

doi = "10.1063/1.4937510",

language = "English",

series = "AIP Conference Proceedings",

publisher = "American Institute of Physics",

editor = "\{de Jonge\}, \{Martin D.\} and Paterson, \{David J.\} and Ryan, \{Christopher G.\}",

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}

Zdora, MC, Thibault, P, Herzen, J, Pfeiffer, F & Zanette, I 2016, Simulations of multi-contrast X-ray imaging using near-field speckles. in MD de Jonge, DJ Paterson & CG Ryan (eds), XRM 2014: Proceedings of the 12th International Conference on X-Ray Microscopy., 020016, AIP Conference Proceedings, vol. 1696, American Institute of Physics, International Conference on X-ray Microscopy (XRM) 2014, Melbourne, Victoria, Australia, 26/10/14. https://doi.org/10.1063/1.4937510

Simulations of multi-contrast X-ray imaging using near-field speckles. / Zdora, Marie Christine; Thibault, Pierre; Herzen, Julia et al.
XRM 2014: Proceedings of the 12th International Conference on X-Ray Microscopy. ed. / Martin D. de Jonge; David J. Paterson; Christopher G. Ryan. American Institute of Physics, 2016. 020016 (AIP Conference Proceedings; Vol. 1696).

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research

TY - GEN

T1 - Simulations of multi-contrast X-ray imaging using near-field speckles

AU - Zdora, Marie Christine

AU - Thibault, Pierre

AU - Herzen, Julia

AU - Pfeiffer, Franz

AU - Zanette, Irene

N1 - Conference code: 12th

PY - 2016/1/28

Y1 - 2016/1/28

N2 - X-ray dark-field and phase-contrast imaging using near-field speckles is a novel technique that overcomes limitations inherent in conventional absorption X-ray imaging, i.e. poor contrast for features with similar density. Speckle-based imaging yields a wealth of information with a simple setup tolerant to polychromatic and divergent beams, and simple data acquisition and analysis procedures. Here, we present a simulation software used to model the image formation with the speckle-based technique, and we compare simulated results on a phantom sample with experimental synchrotron data. Thorough simulation of a speckle-based imaging experiment will help for better understanding and optimising the technique itself.

AB - X-ray dark-field and phase-contrast imaging using near-field speckles is a novel technique that overcomes limitations inherent in conventional absorption X-ray imaging, i.e. poor contrast for features with similar density. Speckle-based imaging yields a wealth of information with a simple setup tolerant to polychromatic and divergent beams, and simple data acquisition and analysis procedures. Here, we present a simulation software used to model the image formation with the speckle-based technique, and we compare simulated results on a phantom sample with experimental synchrotron data. Thorough simulation of a speckle-based imaging experiment will help for better understanding and optimising the technique itself.

KW - dark-field imaging

KW - near-field speckles

KW - phase-contrast imaging

KW - synchrotron radiation

KW - wavefront simulations

KW - X-ray microscopy

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U2 - 10.1063/1.4937510

DO - 10.1063/1.4937510

M3 - Conference Paper

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T3 - AIP Conference Proceedings

BT - XRM 2014

A2 - de Jonge, Martin D.

A2 - Paterson, David J.

A2 - Ryan, Christopher G.

PB - American Institute of Physics

T2 - International Conference on X-ray Microscopy (XRM) 2014

Y2 - 26 October 2014 through 31 October 2014

ER -

Simulations of multi-contrast X-ray imaging using near-field speckles

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Keywords

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