Simulation of atomic resolution images in STEM

L. J. Allen, A. J. D'Alfonso, M. Bosman, S. D. Findlay, M. P. Oxley, V. J. Keast, J. M. LeBeau, S. Stemmer

Research output: Contribution to journalArticleResearchpeer-review

Original languageEnglish
Pages (from-to)922-923
Number of pages2
JournalMicroscopy and Microanalysis
Issue numberSUPPL. 2
Publication statusPublished - 1 Aug 2008

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