Simulation of atomic resolution images in STEM

L. J. Allen, A. J. D'Alfonso, M. Bosman, S. D. Findlay, M. P. Oxley, V. J. Keast, J. M. LeBeau, S. Stemmer

Research output: Contribution to journalArticleResearchpeer-review

Original languageEnglish
Pages (from-to)922-923
Number of pages2
JournalMicroscopy and Microanalysis
Volume14
Issue numberSUPPL. 2
DOIs
Publication statusPublished - 1 Aug 2008

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