Simulation of atomic resolution images in STEM

L. J. Allen, A. J. D'Alfonso, M. Bosman, S. D. Findlay, M. P. Oxley, V. J. Keast, J. M. LeBeau, S. Stemmer

Research output: Contribution to journalMeeting AbstractOther

Original languageEnglish
Pages (from-to)922-923
Number of pages2
JournalMicroscopy and Microanalysis
Volume14
Issue numberSUPPL. 2
DOIs
Publication statusPublished - 1 Aug 2008
Externally publishedYes
EventMicroscopy and Microanalysis 2008 - Albuquerque, United States of America
Duration: 2 Sep 20085 Sep 2008

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