Simulating atomic resolution STEM images of non-periodic samples

S. D. Findlay, A. J. D'Alfonso, L. J. Allen, M. P. Oxley, P. D. Nellist, E. C. Cosgriff, G. Behan, A. Kirkland, N. Shibata, T. Mizoguchi, Y. Ikuhara

Research output: Contribution to journalMeeting Abstractpeer-review

Original languageEnglish
Pages (from-to)928-929
Number of pages2
JournalMicroscopy and Microanalysis
Volume14
Issue numberSUPPL. 2
DOIs
Publication statusPublished - 1 Aug 2008
EventMicroscopy and Microanalysis 2008 - Albuquerque, United States of America
Duration: 2 Sep 20085 Sep 2008

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