Simulating atomic resolution STEM images of non-periodic samples

S. D. Findlay; A. J. D'Alfonso; L. J. Allen; M. P. Oxley; P. D. Nellist; E. C. Cosgriff; G. Behan; A. Kirkland; N. Shibata; T. Mizoguchi; Y. Ikuhara

doi:10.1017/S1431927608084080

Simulating atomic resolution STEM images of non-periodic samples

S. D. Findlay, A. J. D'Alfonso, L. J. Allen, M. P. Oxley, P. D. Nellist, E. C. Cosgriff, G. Behan, A. Kirkland, N. Shibata, T. Mizoguchi, Y. Ikuhara

School of Physics and Astronomy

Research output: Contribution to journal › Meeting Abstract › peer-review

Original language	English
Pages (from-to)	928-929
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	14
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927608084080
Publication status	Published - 1 Aug 2008
Event	Microscopy and Microanalysis 2008 - Albuquerque, United States of America Duration: 2 Sept 2008 → 5 Sept 2008

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@article{0b7d3c91fc144783a9a676c528890741,

title = "Simulating atomic resolution STEM images of non-periodic samples",

author = "Findlay, {S. D.} and D'Alfonso, {A. J.} and Allen, {L. J.} and Oxley, {M. P.} and Nellist, {P. D.} and Cosgriff, {E. C.} and G. Behan and A. Kirkland and N. Shibata and T. Mizoguchi and Y. Ikuhara",

year = "2008",

month = aug,

day = "1",

doi = "10.1017/S1431927608084080",

language = "English",

volume = "14",

pages = "928--929",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

number = "SUPPL. 2",

note = "Microscopy and Microanalysis 2008 ; Conference date: 02-09-2008 Through 05-09-2008",

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TY - JOUR

T1 - Simulating atomic resolution STEM images of non-periodic samples

AU - Findlay, S. D.

AU - D'Alfonso, A. J.

AU - Allen, L. J.

AU - Oxley, M. P.

AU - Nellist, P. D.

AU - Cosgriff, E. C.

AU - Behan, G.

AU - Kirkland, A.

AU - Shibata, N.

AU - Mizoguchi, T.

AU - Ikuhara, Y.

PY - 2008/8/1

Y1 - 2008/8/1

UR - http://www.scopus.com/inward/record.url?scp=49549107290&partnerID=8YFLogxK

U2 - 10.1017/S1431927608084080

DO - 10.1017/S1431927608084080

M3 - Meeting Abstract

AN - SCOPUS:49549107290

SN - 1431-9276

VL - 14

SP - 928

EP - 929

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

T2 - Microscopy and Microanalysis 2008

Y2 - 2 September 2008 through 5 September 2008

ER -

Simulating atomic resolution STEM images of non-periodic samples

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