Simulating atomic resolution STEM images of non-periodic samples

S. D. Findlay, A. J. D'Alfonso, L. J. Allen, M. P. Oxley, P. D. Nellist, E. C. Cosgriff, G. Behan, A. Kirkland, N. Shibata, T. Mizoguchi, Y. Ikuhara

Research output: Contribution to journalArticleResearchpeer-review

Original languageEnglish
Pages (from-to)928-929
Number of pages2
JournalMicroscopy and Microanalysis
Volume14
Issue numberSUPPL. 2
DOIs
Publication statusPublished - 1 Aug 2008

Cite this

Findlay, S. D., D'Alfonso, A. J., Allen, L. J., Oxley, M. P., Nellist, P. D., Cosgriff, E. C., Behan, G., Kirkland, A., Shibata, N., Mizoguchi, T., & Ikuhara, Y. (2008). Simulating atomic resolution STEM images of non-periodic samples. Microscopy and Microanalysis, 14(SUPPL. 2), 928-929. https://doi.org/10.1017/S1431927608084080