Simulating atomic resolution STEM images of non-periodic samples

S. D. Findlay, A. J. D'Alfonso, L. J. Allen, M. P. Oxley, P. D. Nellist, E. C. Cosgriff, G. Behan, A. Kirkland, N. Shibata, T. Mizoguchi, Y. Ikuhara

Research output: Contribution to journalArticleResearchpeer-review

Original languageEnglish
Pages (from-to)928-929
Number of pages2
JournalMicroscopy and Microanalysis
Issue numberSUPPL. 2
Publication statusPublished - 1 Aug 2008

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