Silicon nanowire based radio-frequency spectrum analyzer

William Peter Corcoran; Trung Duc Vo; Mark David Pelusi; Christelle Monat; Danxia Xu; Adam Densmore; Rubin Ma; Siegfried Janz; David J Moss; Benjamin John Eggleton

doi:10.1364/OE.18.020190

Silicon nanowire based radio-frequency spectrum analyzer

William Peter Corcoran, Trung Duc Vo, Mark David Pelusi, Christelle Monat, Danxia Xu, Adam Densmore, Rubin Ma, Siegfried Janz, David J Moss, Benjamin John Eggleton

Research output: Contribution to journal › Article › Research › peer-review

69 Citations (Scopus)

Original language	English
Pages (from-to)	20190 - 20200
Number of pages	11
Journal	Optics Express
Volume	18
Issue number	19
DOIs	https://doi.org/10.1364/OE.18.020190
Publication status	Published - 2010
Externally published	Yes

Access to Document

10.1364/OE.18.020190

Cite this

@article{7ae73d6e302e4d868c26753859b2d594,

title = "Silicon nanowire based radio-frequency spectrum analyzer",

author = "Corcoran, {William Peter} and Vo, {Trung Duc} and Pelusi, {Mark David} and Christelle Monat and Danxia Xu and Adam Densmore and Rubin Ma and Siegfried Janz and Moss, {David J} and Eggleton, {Benjamin John}",

year = "2010",

doi = "10.1364/OE.18.020190",

language = "English",

volume = "18",

pages = "20190 -- 20200",

journal = "Optics Express",

issn = "1094-4087",

publisher = "Optical Society of America (OSA)",

number = "19",

}

TY - JOUR

T1 - Silicon nanowire based radio-frequency spectrum analyzer

AU - Corcoran, William Peter

AU - Vo, Trung Duc

AU - Pelusi, Mark David

AU - Monat, Christelle

AU - Xu, Danxia

AU - Densmore, Adam

AU - Ma, Rubin

AU - Janz, Siegfried

AU - Moss, David J

AU - Eggleton, Benjamin John

PY - 2010

Y1 - 2010

UR - http://goo.gl/RgFAkz

U2 - 10.1364/OE.18.020190

DO - 10.1364/OE.18.020190

M3 - Article

SN - 1094-4087

VL - 18

SP - 20190

EP - 20200

JO - Optics Express

JF - Optics Express

IS - 19

ER -

Silicon nanowire based radio-frequency spectrum analyzer

Access to Document

Other files and links

Cite this