Silicon nanowire based radio-frequency spectrum analyser

B. Corcoran; T. D. Vo; Mark Pelusi; Christelle Monat; D. X. Xu; Adam Densmore; R. Ma; Siegfried Janz; David J Moss; Benjamin John Eggleton

doi:10.1109/GROUP4.2010.5643325

Silicon nanowire based radio-frequency spectrum analyser

B. Corcoran
, T. D. Vo
, Mark Pelusi
, Christelle Monat
, D. X. Xu
, Adam Densmore
, R. Ma
, Siegfried Janz
, David J Moss
, Benjamin John Eggleton

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

Abstract

We demonstrate a silicon nanowire based radio-frequency spectrum analyzer capable of characterizing ultrahigh speed optical data. Through measurement of 640GBit/s on-off-keyed data we show that although nonlinear loss affects device efficiency, free-carrier dispersion is negligible.

Original language	English
Title of host publication	2010 7th IEEE International Conference on Group IV Photonics, GFP 2010
Pages	365-367
Number of pages	3
DOIs	https://doi.org/10.1109/GROUP4.2010.5643325
Publication status	Published - 2010
Externally published	Yes
Event	IEEE International Conference on Group IV Photonics 2010 - Beijing China, Beijing, China Duration: 1 Sept 2010 → 3 Sept 2010 Conference number: 7th

Conference

Conference	IEEE International Conference on Group IV Photonics 2010
Abbreviated title	GFP 2010
Country/Territory	China
City	Beijing
Period	1/09/10 → 3/09/10

Access to Document

10.1109/GROUP4.2010.5643325

Cite this

@inproceedings{83b5057272ab488a8c20c8c261d1f3a6,

title = "Silicon nanowire based radio-frequency spectrum analyser",

abstract = "We demonstrate a silicon nanowire based radio-frequency spectrum analyzer capable of characterizing ultrahigh speed optical data. Through measurement of 640GBit/s on-off-keyed data we show that although nonlinear loss affects device efficiency, free-carrier dispersion is negligible.",

author = "B. Corcoran and Vo, \{T. D.\} and Mark Pelusi and Christelle Monat and Xu, \{D. X.\} and Adam Densmore and R. Ma and Siegfried Janz and Moss, \{David J\} and Eggleton, \{Benjamin John\}",

year = "2010",

doi = "10.1109/GROUP4.2010.5643325",

language = "English",

isbn = "9781424463442",

pages = "365--367",

booktitle = "2010 7th IEEE International Conference on Group IV Photonics, GFP 2010",

note = "IEEE International Conference on Group IV Photonics 2010, GFP 2010 ; Conference date: 01-09-2010 Through 03-09-2010",

}

Corcoran, B, Vo, TD, Pelusi, M, Monat, C, Xu, DX, Densmore, A, Ma, R, Janz, S, Moss, DJ & Eggleton, BJ 2010, Silicon nanowire based radio-frequency spectrum analyser. in 2010 7th IEEE International Conference on Group IV Photonics, GFP 2010., 5643325, pp. 365-367, IEEE International Conference on Group IV Photonics 2010, Beijing, China, 1/09/10. https://doi.org/10.1109/GROUP4.2010.5643325

TY - GEN

T1 - Silicon nanowire based radio-frequency spectrum analyser

AU - Corcoran, B.

AU - Vo, T. D.

AU - Pelusi, Mark

AU - Monat, Christelle

AU - Xu, D. X.

AU - Densmore, Adam

AU - Ma, R.

AU - Janz, Siegfried

AU - Moss, David J

AU - Eggleton, Benjamin John

N1 - Conference code: 7th

PY - 2010

Y1 - 2010

N2 - We demonstrate a silicon nanowire based radio-frequency spectrum analyzer capable of characterizing ultrahigh speed optical data. Through measurement of 640GBit/s on-off-keyed data we show that although nonlinear loss affects device efficiency, free-carrier dispersion is negligible.

AB - We demonstrate a silicon nanowire based radio-frequency spectrum analyzer capable of characterizing ultrahigh speed optical data. Through measurement of 640GBit/s on-off-keyed data we show that although nonlinear loss affects device efficiency, free-carrier dispersion is negligible.

UR - https://www.scopus.com/pages/publications/78651351563

U2 - 10.1109/GROUP4.2010.5643325

DO - 10.1109/GROUP4.2010.5643325

M3 - Conference Paper

AN - SCOPUS:78651351563

SN - 9781424463442

SP - 365

EP - 367

BT - 2010 7th IEEE International Conference on Group IV Photonics, GFP 2010

T2 - IEEE International Conference on Group IV Photonics 2010

Y2 - 1 September 2010 through 3 September 2010

ER -

Silicon nanowire based radio-frequency spectrum analyser

Abstract

Conference

Access to Document

Other files and links

Cite this