Silicon nanowire based radio-frequency spectrum analyser

B. Corcoran, T. D. Vo, Mark Pelusi, Christelle Monat, D. X. Xu, Adam Densmore, R. Ma, Siegfried Janz, David J Moss, Benjamin John Eggleton

Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

Abstract

We demonstrate a silicon nanowire based radio-frequency spectrum analyzer capable of characterizing ultrahigh speed optical data. Through measurement of 640GBit/s on-off-keyed data we show that although nonlinear loss affects device efficiency, free-carrier dispersion is negligible.

Original languageEnglish
Title of host publication2010 7th IEEE International Conference on Group IV Photonics, GFP 2010
Pages365-367
Number of pages3
DOIs
Publication statusPublished - 2010
Externally publishedYes
EventIEEE International Conference on Group IV Photonics, GFP 2010 - Beijing, China
Duration: 1 Sep 20103 Sep 2010
Conference number: 7th

Conference

ConferenceIEEE International Conference on Group IV Photonics, GFP 2010
CountryChina
CityBeijing
Period1/09/103/09/10

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