Silicon nanowire based radio-frequency spectrum analyser

B. Corcoran; T. D. Vo; Mark Pelusi; Christelle Monat; D. X. Xu; Adam Densmore; R. Ma; Siegfried Janz; David J Moss; Benjamin John Eggleton

doi:10.1109/ECOC.2010.5621130

Silicon nanowire based radio-frequency spectrum analyser

B. Corcoran, T. D. Vo, Mark Pelusi, Christelle Monat, D. X. Xu, Adam Densmore, R. Ma, Siegfried Janz, David J Moss, Benjamin John Eggleton

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

1 Citation (Scopus)

Abstract

We demonstrate a silicon nanowire based radio frequency spectrum analyser based on cross-phase modulation. We show that the device is accurate, with cross-chirp from photogenerated free-carriers negligible and measure RF spectra for 640Gbaud on-off-keyed data.

Original language	English
Title of host publication	ECOC 2010 - 36th European Conference and Exhibition on Optical Communication, Proceedings
Volume	1-2
DOIs	https://doi.org/10.1109/ECOC.2010.5621130
Publication status	Published - 2010
Externally published	Yes
Event	European Conference on Optical Communication (ECOC) 2010 - Lingotto Conference and Exhibition Centre, Torino, Italy Duration: 19 Sept 2010 → 23 Sept 2010 Conference number: 36th https://www.ieee.org/conferences_events/conferences/conferencedetails/index.html?Conf_ID=16814

Conference

Conference	European Conference on Optical Communication (ECOC) 2010
Abbreviated title	ECOC 2010
Country/Territory	Italy
City	Torino
Period	19/09/10 → 23/09/10
Internet address	https://www.ieee.org/conferences_events/conferences/conferencedetails/index.html?Conf_ID=16814

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10.1109/ECOC.2010.5621130

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title = "Silicon nanowire based radio-frequency spectrum analyser",

abstract = "We demonstrate a silicon nanowire based radio frequency spectrum analyser based on cross-phase modulation. We show that the device is accurate, with cross-chirp from photogenerated free-carriers negligible and measure RF spectra for 640Gbaud on-off-keyed data.",

author = "B. Corcoran and Vo, {T. D.} and Mark Pelusi and Christelle Monat and Xu, {D. X.} and Adam Densmore and R. Ma and Siegfried Janz and Moss, {David J} and Eggleton, {Benjamin John}",

year = "2010",

doi = "10.1109/ECOC.2010.5621130",

language = "English",

isbn = "9781424485352",

volume = "1-2",

booktitle = "ECOC 2010 - 36th European Conference and Exhibition on Optical Communication, Proceedings",

note = "European Conference on Optical Communication (ECOC) 2010, ECOC 2010 ; Conference date: 19-09-2010 Through 23-09-2010",

url = "https://www.ieee.org/conferences_events/conferences/conferencedetails/index.html?Conf_ID=16814",

}

Corcoran, B, Vo, TD, Pelusi, M, Monat, C, Xu, DX, Densmore, A, Ma, R, Janz, S, Moss, DJ & Eggleton, BJ 2010, Silicon nanowire based radio-frequency spectrum analyser. in ECOC 2010 - 36th European Conference and Exhibition on Optical Communication, Proceedings. vol. 1-2, 5621130, European Conference on Optical Communication (ECOC) 2010, Torino, Italy, 19/09/10. https://doi.org/10.1109/ECOC.2010.5621130

TY - GEN

T1 - Silicon nanowire based radio-frequency spectrum analyser

AU - Corcoran, B.

AU - Vo, T. D.

AU - Pelusi, Mark

AU - Monat, Christelle

AU - Xu, D. X.

AU - Densmore, Adam

AU - Ma, R.

AU - Janz, Siegfried

AU - Moss, David J

AU - Eggleton, Benjamin John

N1 - Conference code: 36th

PY - 2010

Y1 - 2010

N2 - We demonstrate a silicon nanowire based radio frequency spectrum analyser based on cross-phase modulation. We show that the device is accurate, with cross-chirp from photogenerated free-carriers negligible and measure RF spectra for 640Gbaud on-off-keyed data.

AB - We demonstrate a silicon nanowire based radio frequency spectrum analyser based on cross-phase modulation. We show that the device is accurate, with cross-chirp from photogenerated free-carriers negligible and measure RF spectra for 640Gbaud on-off-keyed data.

UR - http://www.scopus.com/inward/record.url?scp=78650593554&partnerID=8YFLogxK

U2 - 10.1109/ECOC.2010.5621130

DO - 10.1109/ECOC.2010.5621130

M3 - Conference Paper

AN - SCOPUS:78650593554

SN - 9781424485352

VL - 1-2

BT - ECOC 2010 - 36th European Conference and Exhibition on Optical Communication, Proceedings

T2 - European Conference on Optical Communication (ECOC) 2010

Y2 - 19 September 2010 through 23 September 2010

ER -

Silicon nanowire based radio-frequency spectrum analyser

Abstract

Conference

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