Silicon nanowire based radio-frequency spectrum analyser

B. Corcoran, T. D. Vo, Mark Pelusi, Christelle Monat, D. X. Xu, Adam Densmore, R. Ma, Siegfried Janz, David J Moss, Benjamin John Eggleton

Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

1 Citation (Scopus)

Abstract

We demonstrate a silicon nanowire based radio frequency spectrum analyser based on cross-phase modulation. We show that the device is accurate, with cross-chirp from photogenerated free-carriers negligible and measure RF spectra for 640Gbaud on-off-keyed data.

Original languageEnglish
Title of host publicationECOC 2010 - 36th European Conference and Exhibition on Optical Communication, Proceedings
Volume1-2
DOIs
Publication statusPublished - 2010
Externally publishedYes
EventEuropean Conference on Optical Communication (ECOC) 2010 - Lingotto Conference and Exhibition Centre, Torino, Italy
Duration: 19 Sep 201023 Sep 2010
Conference number: 36th
https://www.ieee.org/conferences_events/conferences/conferencedetails/index.html?Conf_ID=16814

Conference

ConferenceEuropean Conference on Optical Communication (ECOC) 2010
Abbreviated titleECOC 2010
CountryItaly
CityTorino
Period19/09/1023/09/10
Internet address

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