Shortening burn-in test: application of Weibull statistical analysis & HVST

Po-leen Ooi, Zainal Abu Kassim, Serge Demidenko

Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

Original languageEnglish
Title of host publicationIMTC/05 - Processings of the IEEE Instrumentation and Measurement Technology Conference
EditorsE Petriu, et al
Place of PublicationUSA
PublisherIEEE, Institute of Electrical and Electronics Engineers
Pages49 - 54
Number of pages6
Volume1
ISBN (Print)0-7803-8880-1
Publication statusPublished - 2005
Event22nd IEEE Instrumentation and Measurement Technology Conference - Ottawa, ON, Canada
Duration: 16 May 200519 May 2005
Conference number: 22

Conference

Conference22nd IEEE Instrumentation and Measurement Technology Conference
Abbreviated titleIMTC '05
CountryCanada
CityOttawa, ON
Period16/05/0519/05/05

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