Shortening Burn-in test: application of a novel approach in optimizing burn-in using Weibull statistical analysis and HVST

Fairuz Zakaria, I S Gupta (Editor), Po-leen Ooi, Zainal Abu Kassim, Serge Demidenko

Research output: Contribution to conference › Abstract

Original language	English
Pages	472 - 472
Number of pages	1
Publication status	Published - 2005
Event	IEEE Asian Test Symposium - Calcutta, India, USA Duration: 18 Dec 2005 → 21 Dec 2005

Cite this

@conference{b343050cf4724ea1b4277505acd221f8,

title = "Shortening Burn-in test: application of a novel approach in optimizing burn-in using Weibull statistical analysis and HVST",

author = "Fairuz Zakaria and Gupta, \{I S\} and Po-leen Ooi and Kassim, \{Zainal Abu\} and Serge Demidenko",

year = "2005",

language = "English",

pages = "472 -- 472",

note = "IEEE Asian Test Symposium ; Conference date: 18-12-2005 Through 21-12-2005",

}

TY - CONF

T1 - Shortening Burn-in test: application of a novel approach in optimizing burn-in using Weibull statistical analysis and HVST

AU - Zakaria, Fairuz

AU - Ooi, Po-leen

AU - Kassim, Zainal Abu

AU - Demidenko, Serge

A2 - Gupta, I S

PY - 2005

Y1 - 2005

M3 - Abstract

SP - 472

EP - 472

T2 - IEEE Asian Test Symposium

Y2 - 18 December 2005 through 21 December 2005

ER -