Shortening Burn-in test: application of a novel approach in optimizing burn-in using Weibull statistical analysis and HVST

Fairuz Zakaria, I S Gupta (Editor), Po-leen Ooi, Zainal Abu Kassim, Serge Demidenko

Research output: Contribution to conferenceAbstract

Original languageEnglish
Pages472 - 472
Number of pages1
Publication statusPublished - 2005
EventIEEE Asian Test Symposium - Calcutta, India, USA
Duration: 18 Dec 200521 Dec 2005

Conference

ConferenceIEEE Asian Test Symposium
CityUSA
Period18/12/0521/12/05

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