Semi-supervised Bayesian attribute learning for person re-identification

Wenhe Liu, Xiaojun Chang, Ling Chen, Yi Yang

Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

16 Citations (Scopus)


Person re-identification (re-ID) tasks aim to identify the same person in multiple images captured from non-overlapping camera views. Most previous re-ID studies have attempted to solve this problem through either representation learning or metric learning, or by combining both techniques. Representation learning relies on the latent factors or attributes of the data. In most of these works, the dimensionality of the factors/attributes has to be manually determined for each new dataset. Thus, this approach is not robust. Metric learning optimizes a metric across the dataset to measure similarity according to distance. However, choosing the optimal method for computing these distances is data dependent, and learning the appropriate metric relies on a sufficient number of pair-wise labels. To overcome these limitations, we propose a novel algorithm for person re-ID, called semi-supervised Bayesian attribute learning. We introduce an Indian Buffet Process to identify the priors of the latent attributes. The dimensionality of attributes factors is then automatically determined by nonparametric Bayesian learning. Meanwhile, unlike traditional distance metric learning, we propose a re-identification probability distribution to describe how likely it is that a pair of images contains the same person. This technique relies solely on the latent attributes of both images. Moreover, pair-wise labels that are not known can be estimated from pair-wise labels that are known, making this a robust approach for semi-supervised learning. Extensive experiments demonstrate the superior performance of our algorithm over several state-of-the-art algorithms on small-scale datasets and comparable performance on large-scale re-ID datasets.

Original languageEnglish
Title of host publicationThe Thirty-Second AAAI Conference on Artificial Intelligence
EditorsSheila McIlraith, Kilian Weinberger
Place of PublicationPalo Alto CA USA
PublisherAssociation for the Advancement of Artificial Intelligence (AAAI)
Number of pages8
ISBN (Electronic)9781577358008
Publication statusPublished - 2018
Externally publishedYes
EventAAAI Conference on Artificial Intelligence 2018 - New Orleans, United States of America
Duration: 2 Feb 20187 Feb 2018
Conference number: 32nd


ConferenceAAAI Conference on Artificial Intelligence 2018
Abbreviated titleAAAI 2018
Country/TerritoryUnited States of America
CityNew Orleans
Internet address

Cite this