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Semantic-aware domain generalized segmentation

Duo Peng, Yinjie Lei, Munawar Hayat, Yulan Guo, Wen Li

Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

Abstract

Deep models trained on source domain lack generalization when evaluated on unseen target domains with different data distributions. The problem becomes even more pro-nounced when we have no access to target domain samples for adaptation. In this paper, we address domain generalized semantic segmentation, where a segmentation model is trained to be domain-invariant without using any target domain data. Existing approaches to tackle this problem standardize data into a unified distribution. We argue that while such a standardization promotes global normalization, the resulting features are not discriminative enough to get clear segmentation boundaries. To enhance separation between categories while simultaneously promoting domain invariance, we propose a framework including two novel modules: Semantic-Aware Normalization (SAN) and Semantic-Aware Whitening (SAW). Specifically, SAN focuses on category-level center alignment between features from different image styles, while SAW enforces distributed alignment for the already center-aligned features. With the help of SAN and SAW, we encourage both intra-category compactness and inter-category separability. We validate our approach through extensive experiments on widely-used datasets (i.e. GTAV, SYNTHIA, Cityscapes, Mapillary and BDDS). Our approach shows significant improvements over existing state-of-the-art on various backbone networks. Code is available at https://github.com/leolyj/SAN-SAW

Original languageEnglish
Title of host publicationProceedings - 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2022
EditorsKosta Derpanis
Place of PublicationPiscataway NJ USA
PublisherIEEE, Institute of Electrical and Electronics Engineers
Pages2584-2595
Number of pages12
ISBN (Electronic)9781665469463
ISBN (Print)9781665469470
DOIs
Publication statusPublished - 2022
EventIEEE Conference on Computer Vision and Pattern Recognition 2022 - New Orleans, United States of America
Duration: 19 Jun 202224 Jun 2022
https://ieeexplore.ieee.org/xpl/conhome/9878378/proceeding (Proceedings)
https://cvpr2022.thecvf.com
https://cvpr2022.thecvf.com/ (Website)

Conference

ConferenceIEEE Conference on Computer Vision and Pattern Recognition 2022
Abbreviated titleCVPR 2022
Country/TerritoryUnited States of America
CityNew Orleans
Period19/06/2224/06/22
Internet address

Keywords

  • Deep learning architectures and techniques
  • grouping and shape analysis
  • Scene analysis and understanding
  • Segmentation
  • Transfer/low-shot/long-tail learning

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