| Original language | English |
|---|---|
| Pages (from-to) | 343 - 360 |
| Number of pages | 18 |
| Journal | Ultramicroscopy |
| Volume | 96 |
| Issue number | 3-4 |
| Publication status | Published - 2003 |
Scattering of A-scale electron probes in silicon
Christian Dwyer, Joanne Etheridge
Research output: Contribution to journal › Article › Research › peer-review
80
Citations
(Scopus)