Scanning transmission electron microscopy imaging dynamics at low accelerating voltages

Nathan Lugg; Scott Findlay; Naoya Shibata; Teruyasu Mizoguchi; Adrian D'Alfonso; Leslie Allen; Yumi Ikuhara

doi:10.1016/j.ultramic.2011.02.009

Scanning transmission electron microscopy imaging dynamics at low accelerating voltages

Nathan Lugg, Scott Findlay, Naoya Shibata, Teruyasu Mizoguchi, Adrian D'Alfonso, Leslie Allen, Yumi Ikuhara

Research output: Contribution to journal › Article › Research › peer-review

6 Citations (Scopus)

Abstract

Motivated by the desire to minimize specimen damage in beam sensitive specimens, there has been a recent push toward using relatively low accelerating voltages (

Original language	English
Pages (from-to)	999 - 1013
Number of pages	15
Journal	Ultramicroscopy
Volume	111
Issue number	8
DOIs	https://doi.org/10.1016/j.ultramic.2011.02.009
Publication status	Published - 2011
Externally published	Yes

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10.1016/j.ultramic.2011.02.009

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@article{2c80aad1882544c4b302277cd0b55461,

title = "Scanning transmission electron microscopy imaging dynamics at low accelerating voltages",

abstract = "Motivated by the desire to minimize specimen damage in beam sensitive specimens, there has been a recent push toward using relatively low accelerating voltages (",

author = "Nathan Lugg and Scott Findlay and Naoya Shibata and Teruyasu Mizoguchi and Adrian D'Alfonso and Leslie Allen and Yumi Ikuhara",

year = "2011",

doi = "10.1016/j.ultramic.2011.02.009",

language = "English",

volume = "111",

pages = "999 -- 1013",

journal = "Ultramicroscopy",

issn = "0304-3991",

publisher = "Elsevier BV",

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T1 - Scanning transmission electron microscopy imaging dynamics at low accelerating voltages

AU - Lugg, Nathan

AU - Findlay, Scott

AU - Shibata, Naoya

AU - Mizoguchi, Teruyasu

AU - D'Alfonso, Adrian

AU - Allen, Leslie

AU - Ikuhara, Yumi

PY - 2011

Y1 - 2011

N2 - Motivated by the desire to minimize specimen damage in beam sensitive specimens, there has been a recent push toward using relatively low accelerating voltages (

AB - Motivated by the desire to minimize specimen damage in beam sensitive specimens, there has been a recent push toward using relatively low accelerating voltages (

UR - http://www.sciencedirect.com.ezproxy.lib.monash.edu.au/science/article/pii/S0304399111000854

UR - https://www.scopus.com/pages/publications/79959937889

U2 - 10.1016/j.ultramic.2011.02.009

DO - 10.1016/j.ultramic.2011.02.009

M3 - Article

SN - 0304-3991

VL - 111

SP - 999

EP - 1013

JO - Ultramicroscopy

JF - Ultramicroscopy

IS - 8

ER -

Scanning transmission electron microscopy imaging dynamics at low accelerating voltages

Abstract

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