Scanning transmission electron microscopy imaging dynamics at low accelerating voltages

Nathan Lugg, Scott Findlay, Naoya Shibata, Teruyasu Mizoguchi, Adrian D'Alfonso, Leslie Allen, Yumi Ikuhara

Research output: Contribution to journalArticleResearchpeer-review

6 Citations (Scopus)

Abstract

Motivated by the desire to minimize specimen damage in beam sensitive specimens, there has been a recent push toward using relatively low accelerating voltages (
Original languageEnglish
Pages (from-to)999 - 1013
Number of pages15
JournalUltramicroscopy
Volume111
Issue number8
DOIs
Publication statusPublished - 2011
Externally publishedYes

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