Scanning transmission electron microscopy imaging dynamics at low accelerating voltages

Nathan Lugg, Scott Findlay, Naoya Shibata, Teruyasu Mizoguchi, Adrian D'Alfonso, Leslie Allen, Yumi Ikuhara

Research output: Contribution to journalArticleResearchpeer-review

6 Citations (Scopus)

Abstract

Motivated by the desire to minimize specimen damage in beam sensitive specimens, there has been a recent push toward using relatively low accelerating voltages (
Original languageEnglish
Pages (from-to)999 - 1013
Number of pages15
JournalUltramicroscopy
Volume111
Issue number8
DOIs
Publication statusPublished - 2011
Externally publishedYes

Cite this

Lugg, N., Findlay, S., Shibata, N., Mizoguchi, T., D'Alfonso, A., Allen, L., & Ikuhara, Y. (2011). Scanning transmission electron microscopy imaging dynamics at low accelerating voltages. Ultramicroscopy, 111(8), 999 - 1013. https://doi.org/10.1016/j.ultramic.2011.02.009