Scanning confocal electron microscopy in a FEI double corrected titan³ TEM/STEM

Nestor J. Zaluzec, Matthew Weyland, Joanne Etheridge

Research output: Contribution to journal › Meeting Abstract › peer-review

5 Citations (Scopus)

1 results
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Centre for Electron Microscopy (MCEM)
Sorrell, F. (Manager) & Miller, P. (Manager)
Office of the Vice-Provost (Research and Research Infrastructure)
Facility/equipment: Facility