Scanning confocal electron microscopy in a FEI double corrected titan3 TEM/STEM

Nestor J. Zaluzec, Matthew Weyland, Joanne Etheridge

Research output: Contribution to journalArticleOtherpeer-review

Original languageEnglish
Pages (from-to)614-615
Number of pages2
JournalMicroscopy and Microanalysis
Volume15
Issue numberSUPPL. 2
DOIs
Publication statusPublished - Jul 2009

Cite this

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title = "Scanning confocal electron microscopy in a FEI double corrected titan3 TEM/STEM",
author = "Zaluzec, {Nestor J.} and Matthew Weyland and Joanne Etheridge",
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language = "English",
volume = "15",
pages = "614--615",
journal = "Microscopy and Microanalysis",
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publisher = "Cambridge University Press",
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}

Scanning confocal electron microscopy in a FEI double corrected titan3 TEM/STEM. / Zaluzec, Nestor J.; Weyland, Matthew; Etheridge, Joanne.

In: Microscopy and Microanalysis, Vol. 15, No. SUPPL. 2, 07.2009, p. 614-615.

Research output: Contribution to journalArticleOtherpeer-review

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AU - Weyland, Matthew

AU - Etheridge, Joanne

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