Scanning confocal electron microscopy in a FEI double corrected titan3 TEM/STEM

Nestor J. Zaluzec, Matthew Weyland, Joanne Etheridge

Research output: Contribution to journalArticleOtherpeer-review

4 Citations (Scopus)
Original languageEnglish
Pages (from-to)614-615
Number of pages2
JournalMicroscopy and Microanalysis
Volume15
Issue numberSUPPL. 2
DOIs
Publication statusPublished - Jul 2009

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