Scanning confocal electron microscopy in a FEI double corrected titan3 TEM/STEM

Nestor J. Zaluzec; Matthew Weyland; Joanne Etheridge

doi:10.1017/S1431927609097840

Scanning confocal electron microscopy in a FEI double corrected titan³ TEM/STEM

Nestor J. Zaluzec, Matthew Weyland, Joanne Etheridge

Research output: Contribution to journal › Meeting Abstract › peer-review

Original language	English
Pages (from-to)	614-615
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	15
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927609097840
Publication status	Published - Jul 2009

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10.1017/S1431927609097840

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title = "Scanning confocal electron microscopy in a FEI double corrected titan3 TEM/STEM",

author = "Zaluzec, {Nestor J.} and Matthew Weyland and Joanne Etheridge",

year = "2009",

month = jul,

doi = "10.1017/S1431927609097840",

language = "English",

volume = "15",

pages = "614--615",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

number = "SUPPL. 2",

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TY - JOUR

T1 - Scanning confocal electron microscopy in a FEI double corrected titan3 TEM/STEM

AU - Zaluzec, Nestor J.

AU - Weyland, Matthew

AU - Etheridge, Joanne

PY - 2009/7

Y1 - 2009/7

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U2 - 10.1017/S1431927609097840

DO - 10.1017/S1431927609097840

M3 - Meeting Abstract

AN - SCOPUS:69949180007

SN - 1431-9276

VL - 15

SP - 614

EP - 615

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -

Scanning confocal electron microscopy in a FEI double corrected titan³ TEM/STEM

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Centre for Electron Microscopy (MCEM)

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Scanning confocal electron microscopy in a FEI double corrected titan3 TEM/STEM

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Centre for Electron Microscopy (MCEM)

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Scanning confocal electron microscopy in a FEI double corrected titan³ TEM/STEM