Scalable data dissemination protocol for wireless sensor networks

Haifeng Lu, Chuan Heng Foh, Jianfei Cai

Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

2 Citations (Scopus)

Abstract

Opportunistic wireless transmission is a technique offering collaboration of simultaneous flows to achieve error resilient transmissions. In this paper, we introduce the use of opportunistic wireless transmission for data diffusion which deals with the all-to-all data dissemination in a wireless sensor network. Our design turns the network infrastructure into a single fountain encoder where source packets arrive from each sensor node and these packets are encoded while flooding throughout the entire network to all nodes. Simulation and analysis are carried out showing that our proposed opportunistic data diffusion achieves efficient and error resilient all-to-all data dissemination. The results confirm that our solution offers not only efficient and reliable all-to-all data dissemination over lossy wireless links, but also scalability to large networks.

Original languageEnglish
Title of host publication2012 18th IEEE International Conference on Networks, ICON 2012
PublisherIEEE, Institute of Electrical and Electronics Engineers
Pages471-476
Number of pages6
ISBN (Print)9781467345217
DOIs
Publication statusPublished - 2012
Externally publishedYes
Event2012 18th IEEE International Conference on Networks, ICON 2012 - Singapore, Singapore
Duration: 12 Dec 201214 Dec 2012

Publication series

NameIEEE International Conference on Networks, ICON
ISSN (Print)1556-6463

Conference

Conference2012 18th IEEE International Conference on Networks, ICON 2012
CountrySingapore
CitySingapore
Period12/12/1214/12/12

Cite this

Lu, H., Foh, C. H., & Cai, J. (2012). Scalable data dissemination protocol for wireless sensor networks. In 2012 18th IEEE International Conference on Networks, ICON 2012 (pp. 471-476). [6506603] (IEEE International Conference on Networks, ICON). IEEE, Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/ICON.2012.6506603