Satellite-based soil moisture validation and field experiments; Skylab to smap

T. J. Jackson, J P Wigneron, Yann Kerr, Michael Cosh, A. Colliander, J. Walker, R. Bindlish

Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

2 Citations (Scopus)

Abstract

Field experiments have played a critical role in the development and implementation of satellite soil moisture missions. A review of key experiments is presented that includes tower-, aircraft, and satellite-focused efforts conducted over four decades that have supported two dedicated satellite missions; Soil Moisture Ocean Salinity (SMOS) and Soil Moisture Active passive (SMAP).

Original languageEnglish
Title of host publication2016 IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2016 - Proceedings
Subtitle of host publicationJuly 10–15, 2016, Beijing, China
EditorsJiancheng Shi, Huadong Guo, Kun-Shan Chen
Place of PublicationPiscataway, NJ
PublisherIEEE, Institute of Electrical and Electronics Engineers
Pages3462-3465
Number of pages4
ISBN (Electronic)9781509033324, 9781509033317
ISBN (Print)9781509033331
DOIs
Publication statusPublished - 1 Nov 2016
EventIEEE International Geoscience and Remote Sensing Symposium 2016 - China National Convention Center, Beijing, China
Duration: 10 Jul 201615 Jul 2016
Conference number: 36th
https://www2.securecms.com/IGARSS2016/Default.asp
http://www.igarss2016.org/

Conference

ConferenceIEEE International Geoscience and Remote Sensing Symposium 2016
Abbreviated titleIGARSS 2016
CountryChina
CityBeijing
Period10/07/1615/07/16
Internet address

Keywords

  • field experiments
  • microwave remote sensing
  • Soil moisture

Cite this

Jackson, T. J., Wigneron, J. P., Kerr, Y., Cosh, M., Colliander, A., Walker, J., & Bindlish, R. (2016). Satellite-based soil moisture validation and field experiments; Skylab to smap. In J. Shi, H. Guo, & K-S. Chen (Eds.), 2016 IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2016 - Proceedings: July 10–15, 2016, Beijing, China (pp. 3462-3465). [7729895] IEEE, Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/IGARSS.2016.7729895