Robust feature matching in 2.3 mu s

Simon Taylor; Edward Rosten; Thomas Drummond

Robust feature matching in 2.3 mu s

Simon Taylor
, Edward Rosten
, Thomas Drummond

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

Original language	English
Title of host publication	Proceedings of 2009 IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops (CVPR Workshops 2009)
Editors	Patrick Flynn, Eric Mortensen
Place of Publication	New York USA
Publisher	IEEE, Institute of Electrical and Electronics Engineers
Pages	1 - 8
Number of pages	8
ISBN (Print)	9781424439942
Publication status	Published - 2009
Externally published	Yes
Event	IEEE Conference on Computer Vision and Pattern Recognition 2009 - Miami, United States of America Duration: 20 Jun 2009 → 25 Jun 2009 https://ieeexplore.ieee.org/xpl/conhome/5191365/proceeding (Proceedings)

Conference

Conference	IEEE Conference on Computer Vision and Pattern Recognition 2009
Abbreviated title	CVPR 2009
Country/Territory	United States of America
City	Miami
Period	20/06/09 → 25/06/09
Internet address	https://ieeexplore.ieee.org/xpl/conhome/5191365/proceeding (Proceedings)

Cite this

@inproceedings{87e8b54aa1624c109c727b244a269df6,

title = "Robust feature matching in 2.3 mu s",

author = "Simon Taylor and Edward Rosten and Thomas Drummond",

year = "2009",

language = "English",

isbn = "9781424439942",

pages = "1 -- 8",

editor = "Patrick Flynn and Eric Mortensen",

booktitle = "Proceedings of 2009 IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops (CVPR Workshops 2009)",

publisher = "IEEE, Institute of Electrical and Electronics Engineers",

address = "United States of America",

note = "IEEE Conference on Computer Vision and Pattern Recognition 2009, CVPR 2009 ; Conference date: 20-06-2009 Through 25-06-2009",

url = "https://ieeexplore.ieee.org/xpl/conhome/5191365/proceeding",

}

Taylor, S, Rosten, E & Drummond, T 2009, Robust feature matching in 2.3 mu s. in P Flynn & E Mortensen (eds), Proceedings of 2009 IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops (CVPR Workshops 2009). IEEE, Institute of Electrical and Electronics Engineers, New York USA, pp. 1 - 8, IEEE Conference on Computer Vision and Pattern Recognition 2009, Miami, Florida, United States of America, 20/06/09.

Robust feature matching in 2.3 mu s. / Taylor, Simon; Rosten, Edward; Drummond, Thomas.
Proceedings of 2009 IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops (CVPR Workshops 2009). ed. / Patrick Flynn; Eric Mortensen. New York USA: IEEE, Institute of Electrical and Electronics Engineers, 2009. p. 1 - 8.

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

TY - GEN

T1 - Robust feature matching in 2.3 mu s

AU - Taylor, Simon

AU - Rosten, Edward

AU - Drummond, Thomas

PY - 2009

Y1 - 2009

UR - http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5204314

M3 - Conference Paper

SN - 9781424439942

SP - 1

EP - 8

BT - Proceedings of 2009 IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops (CVPR Workshops 2009)

A2 - Flynn, Patrick

A2 - Mortensen, Eric

PB - IEEE, Institute of Electrical and Electronics Engineers

CY - New York USA

T2 - IEEE Conference on Computer Vision and Pattern Recognition 2009

Y2 - 20 June 2009 through 25 June 2009

ER -

Robust feature matching in 2.3 mu s

Conference

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Cite this