Robust feature matching in 2.3 mu s

Simon Taylor, Edward Rosten, Thomas Drummond

Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

Original languageEnglish
Title of host publicationProceedings of 2009 IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops (CVPR Workshops 2009)
EditorsPatrick Flynn, Eric Mortensen
Place of PublicationNew York USA
PublisherIEEE, Institute of Electrical and Electronics Engineers
Pages1 - 8
Number of pages8
ISBN (Print)9781424439942
Publication statusPublished - 2009
Externally publishedYes
EventIEEE Conference on Computer Vision and Pattern Recognition 2009 - Miami, United States of America
Duration: 20 Jun 200925 Jun 2009
https://ieeexplore.ieee.org/xpl/conhome/5191365/proceeding (Proceedings)

Conference

ConferenceIEEE Conference on Computer Vision and Pattern Recognition 2009
Abbreviated titleCVPR 2009
CountryUnited States of America
CityMiami
Period20/06/0925/06/09
Internet address

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