Robust atomic resolution imaging of light elements using scanning transmission electron microscopy

Scott Findlay, Naoya Shibata, Hidetaka Sawada, E Okunishi, Yukihito Kondo, T Yamamoto, Yuichi Ikuhara

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262 Citations (Scopus)

Abstract

We show that an annular detector placed within the bright field cone in scanning transmission electron microscopy allows direct imaging of light elements in crystals. In contrast to common high angle annular dark field imaging, both light and heavy atom columns are visible simultaneously. In contrast to common bright field imaging, the images are directly and robustly interpretable over a large range of thicknesses. We demonstrate this through systematic simulations and present a simple physical model to obtain some insight into the scattering dynamics.
Original languageEnglish
Pages (from-to)191913-1 - 191913-3
Number of pages3
JournalApplied Physics Letters
Volume95
Issue number19
DOIs
Publication statusPublished - 2009
Externally publishedYes

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