Reversible and nonvolatile ferroelectric control of two-dimensional electronic transport properties of ZrCuSiAs-type copper oxyselenide thin films with a layered structure

Xu-Wen Zhao, Guan-Yin Gao, Jian-Min Yan, Lei Chen, Meng Xu, Wei-Yao Zhao, Zhi-Xue Xu, Lei Guo, Yu-Kuai Liu, Xiao-Guang Li, Yu Wang, Ren-Kui Zheng

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7 Citations (Scopus)


Copper-based ZrCuSiAs-type compounds of LnCuChO (Ln=Bi and lanthanides, Ch=S, Se, Te) with a layered crystal structure continuously attract worldwide attention in recent years. Although their high-temperature (T ≥ 300 K) electrical properties have been intensively studied, their low-temperature electronic transport properties are little known. In this paper, we report the integration of ZrCuSiAs-type copper oxyselenide thin films of Bi0.94Pb0.06CuSeO (BPCSO) with perovskite-type ferroelectric Pb(Mg1/3Nb2/3)O3-PbTiO3 (PMN-PT) single crystals in the form of ferroelectric field effect devices that allow us to control the electronic properties (e.g., carrier density, magnetoconductance, dephasing length, etc.) of BPCSO films in a reversible and nonvolatile manner by polarization switching at room temperature. Combining ferroelectric gating and magnetotransport measurements with the Hikami-Larkin-Nagaoka theory, we demonstrate two-dimensional (2D) electronic transport characteristics and weak antilocalization effect as well as strong carrier-density-mediated competition between weak antilocalization and weak localization in BPCSO films. Our results show that ferroelectric gating using PMN-PT provides an effective and convenient approach to probe the carrier-density-related 2D electronic transport properties of ZrCuSiAs-type copper oxyselenide thin films.

Original languageEnglish
Article number055003
Number of pages8
JournalPhysical Review Materials
Issue number5
Publication statusPublished - 24 May 2018
Externally publishedYes

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