Original language | English |
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Pages (from-to) | 75 - 78 |
Number of pages | 4 |
Journal | Optical Engineering |
Volume | 73 |
Issue number | 1 |
DOIs | |
Publication status | Published - 2004 |
Resolution analysis of atomic force microscopy using temporal phase modulation interferometry
Tuck Wah Ng, Osami Sasaki, H T Chua
Research output: Contribution to journal › Article › Research › peer-review
3
Citations
(Scopus)