Residual stress analysis around foreign object damage using synchrotron diffraction

P. Frankel, J. Ding, M. Preuss, J. Byrne, P. J. Withers

Research output: Chapter in Book/Report/Conference proceedingConference PaperOther

2 Citations (Scopus)

Abstract

The current study compares the residual strain around foreign object damage (FOD), measured using synchrotron diffraction, to the strain predicted by a plastic model with power-law dependence. It is shown that the measured strains are significantly lower than those predicted by the model. This may be explained in part, by the inability of the model to account for damage mechanisms such as micro-cracking and shear band formation.

Original languageEnglish
Title of host publicationResidual Stresses VII - Proceedings of the 7th European Conference on Residual Stresses, ECRS 7
EditorsWalter Reimers, S. Quander
PublisherTrans Tech Publications
Pages291-296
Number of pages6
ISBN (Print)9780878494149
DOIs
Publication statusPublished - 2006
Externally publishedYes
EventEuropean Conference on Residual Stresses (ECRS) 2006 - Berlin, Germany
Duration: 13 Sep 200615 Sep 2006
Conference number: 7th

Publication series

NameMaterials Science Forum
Volume524-525
ISSN (Print)0255-5476
ISSN (Electronic)1662-9752

Conference

ConferenceEuropean Conference on Residual Stresses (ECRS) 2006
Abbreviated titleECRS 2006
CountryGermany
CityBerlin
Period13/09/0615/09/06

Keywords

  • Foreign object damage (FOD)
  • Residual stress
  • Synchrotron diffraction
  • Ti-6Al-4V

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