Residual stress analysis around foreign object damage using synchrotron diffraction

P. Frankel; J. Ding; M. Preuss; J. Byrne; P. J. Withers

doi:10.4028/0-87849-414-6.291

Residual stress analysis around foreign object damage using synchrotron diffraction

P. Frankel, J. Ding, M. Preuss, J. Byrne, P. J. Withers

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Other

2 Citations (Scopus)

Abstract

The current study compares the residual strain around foreign object damage (FOD), measured using synchrotron diffraction, to the strain predicted by a plastic model with power-law dependence. It is shown that the measured strains are significantly lower than those predicted by the model. This may be explained in part, by the inability of the model to account for damage mechanisms such as micro-cracking and shear band formation.

Original language	English
Title of host publication	Residual Stresses VII - Proceedings of the 7th European Conference on Residual Stresses, ECRS 7
Editors	Walter Reimers, S. Quander
Publisher	Trans Tech Publications
Pages	291-296
Number of pages	6
ISBN (Print)	9780878494149
DOIs	https://doi.org/10.4028/0-87849-414-6.291
Publication status	Published - 2006
Externally published	Yes
Event	European Conference on Residual Stresses (ECRS) 2006 - Berlin, Germany Duration: 13 Sept 2006 → 15 Sept 2006 Conference number: 7th

Publication series

Name	Materials Science Forum
Volume	524-525
ISSN (Print)	0255-5476
ISSN (Electronic)	1662-9752

Conference

Conference	European Conference on Residual Stresses (ECRS) 2006
Abbreviated title	ECRS 2006
Country/Territory	Germany
City	Berlin
Period	13/09/06 → 15/09/06

Keywords

Foreign object damage (FOD)
Residual stress
Synchrotron diffraction
Ti-6Al-4V

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10.4028/0-87849-414-6.291

Cite this

Frankel, P., Ding, J., Preuss, M., Byrne, J., & Withers, P. J. (2006). Residual stress analysis around foreign object damage using synchrotron diffraction. In W. Reimers, & S. Quander (Eds.), Residual Stresses VII - Proceedings of the 7th European Conference on Residual Stresses, ECRS 7 (pp. 291-296). (Materials Science Forum; Vol. 524-525). Trans Tech Publications. https://doi.org/10.4028/0-87849-414-6.291

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title = "Residual stress analysis around foreign object damage using synchrotron diffraction",

abstract = "The current study compares the residual strain around foreign object damage (FOD), measured using synchrotron diffraction, to the strain predicted by a plastic model with power-law dependence. It is shown that the measured strains are significantly lower than those predicted by the model. This may be explained in part, by the inability of the model to account for damage mechanisms such as micro-cracking and shear band formation.",

keywords = "Foreign object damage (FOD), Residual stress, Synchrotron diffraction, Ti-6Al-4V",

author = "P. Frankel and J. Ding and M. Preuss and J. Byrne and Withers, {P. J.}",

year = "2006",

doi = "10.4028/0-87849-414-6.291",

language = "English",

isbn = "9780878494149",

series = "Materials Science Forum",

publisher = "Trans Tech Publications",

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editor = "Walter Reimers and S. Quander",

booktitle = "Residual Stresses VII - Proceedings of the 7th European Conference on Residual Stresses, ECRS 7",

address = "Switzerland",

note = "European Conference on Residual Stresses (ECRS) 2006, ECRS 2006 ; Conference date: 13-09-2006 Through 15-09-2006",

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Frankel, P, Ding, J, Preuss, M, Byrne, J & Withers, PJ 2006, Residual stress analysis around foreign object damage using synchrotron diffraction. in W Reimers & S Quander (eds), Residual Stresses VII - Proceedings of the 7th European Conference on Residual Stresses, ECRS 7. Materials Science Forum, vol. 524-525, Trans Tech Publications, pp. 291-296, European Conference on Residual Stresses (ECRS) 2006, Berlin, Berlin, Germany, 13/09/06. https://doi.org/10.4028/0-87849-414-6.291

Residual stress analysis around foreign object damage using synchrotron diffraction. / Frankel, P.; Ding, J.; Preuss, M. et al.
Residual Stresses VII - Proceedings of the 7th European Conference on Residual Stresses, ECRS 7. ed. / Walter Reimers; S. Quander. Trans Tech Publications, 2006. p. 291-296 (Materials Science Forum; Vol. 524-525).

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Other

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T1 - Residual stress analysis around foreign object damage using synchrotron diffraction

AU - Frankel, P.

AU - Ding, J.

AU - Preuss, M.

AU - Byrne, J.

AU - Withers, P. J.

N1 - Conference code: 7th

PY - 2006

Y1 - 2006

N2 - The current study compares the residual strain around foreign object damage (FOD), measured using synchrotron diffraction, to the strain predicted by a plastic model with power-law dependence. It is shown that the measured strains are significantly lower than those predicted by the model. This may be explained in part, by the inability of the model to account for damage mechanisms such as micro-cracking and shear band formation.

AB - The current study compares the residual strain around foreign object damage (FOD), measured using synchrotron diffraction, to the strain predicted by a plastic model with power-law dependence. It is shown that the measured strains are significantly lower than those predicted by the model. This may be explained in part, by the inability of the model to account for damage mechanisms such as micro-cracking and shear band formation.

KW - Foreign object damage (FOD)

KW - Residual stress

KW - Synchrotron diffraction

KW - Ti-6Al-4V

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U2 - 10.4028/0-87849-414-6.291

DO - 10.4028/0-87849-414-6.291

M3 - Conference Paper

AN - SCOPUS:37849009080

SN - 9780878494149

T3 - Materials Science Forum

SP - 291

EP - 296

BT - Residual Stresses VII - Proceedings of the 7th European Conference on Residual Stresses, ECRS 7

A2 - Reimers, Walter

A2 - Quander, S.

PB - Trans Tech Publications

T2 - European Conference on Residual Stresses (ECRS) 2006

Y2 - 13 September 2006 through 15 September 2006

ER -

Residual stress analysis around foreign object damage using synchrotron diffraction

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Keywords

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