Removing the effects of elastic and thermal scattering from electron energy-loss spectroscopic data

Nathan R Lugg; M Haruta; M J Neish; Scott Findlay; Teruyasu Mizoguchi; K Kimoto; Leslie J Allen

doi:10.1063/1.4765657

Removing the effects of elastic and thermal scattering from electron energy-loss spectroscopic data

Nathan R Lugg, M Haruta, M J Neish, Scott Findlay, Teruyasu Mizoguchi, K Kimoto, Leslie J Allen

Research output: Contribution to journal › Article › Research › peer-review

20 Citations (Scopus)

Abstract

Electron energy-loss spectroscopy (EELS) studies in scanning transmission electron microscopy are widely used to investigate the location and bonding of atoms in condensed matter. However, the interpretation of EELS data is complicated by multiple elastic and thermal diffuse scattering of the probing electrons. Here, we present a method for removing these effects from recorded EELS spectrum images, producing visually interpretable elemental maps and enabling direct comparison of the spectral data with established first-principles energy-loss fine structure calculations.

Original language	English
Pages (from-to)	1 - 4
Number of pages	4
Journal	Applied Physics Letters
Volume	101
Issue number	18
DOIs	https://doi.org/10.1063/1.4765657
Publication status	Published - 2012

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10.1063/1.4765657

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abstract = "Electron energy-loss spectroscopy (EELS) studies in scanning transmission electron microscopy are widely used to investigate the location and bonding of atoms in condensed matter. However, the interpretation of EELS data is complicated by multiple elastic and thermal diffuse scattering of the probing electrons. Here, we present a method for removing these effects from recorded EELS spectrum images, producing visually interpretable elemental maps and enabling direct comparison of the spectral data with established first-principles energy-loss fine structure calculations.",

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AU - Lugg, Nathan R

AU - Haruta, M

AU - Neish, M J

AU - Findlay, Scott

AU - Mizoguchi, Teruyasu

AU - Kimoto, K

AU - Allen, Leslie J

PY - 2012

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AB - Electron energy-loss spectroscopy (EELS) studies in scanning transmission electron microscopy are widely used to investigate the location and bonding of atoms in condensed matter. However, the interpretation of EELS data is complicated by multiple elastic and thermal diffuse scattering of the probing electrons. Here, we present a method for removing these effects from recorded EELS spectrum images, producing visually interpretable elemental maps and enabling direct comparison of the spectral data with established first-principles energy-loss fine structure calculations.

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JO - Applied Physics Letters

JF - Applied Physics Letters

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Removing the effects of elastic and thermal scattering from electron energy-loss spectroscopic data

Abstract

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