Rapid Preparation of Nanoscale Resin-Embedded Samples Using Site-Specific Laser Ablation and Focused Ion Beam Milling

Anup Sharma, Levi Tegg, Aristide Djoulde, Deepak Marla, Jing Fu

Research output: Contribution to journal › Article › Research › peer-review

Original language	English
Pages (from-to)	91-92
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	30
Issue number	2024
DOIs	https://doi.org/10.1093/mam/ozae044.046
Publication status	Published - Jul 2024

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title = "Rapid Preparation of Nanoscale Resin-Embedded Samples Using Site-Specific Laser Ablation and Focused Ion Beam Milling",

author = "Anup Sharma and Levi Tegg and Aristide Djoulde and Deepak Marla and Jing Fu",

year = "2024",

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language = "English",

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T1 - Rapid Preparation of Nanoscale Resin-Embedded Samples Using Site-Specific Laser Ablation and Focused Ion Beam Milling

AU - Sharma, Anup

AU - Tegg, Levi

AU - Djoulde, Aristide

AU - Marla, Deepak

AU - Fu, Jing

PY - 2024/7

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JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

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