Rapid imaging of nanotubes on insulating substrates

T. Brintlinger; Yung Fu Chen; T. Dürkop; Enrique Cobas; M. S. Fuhrer; John D. Barry; John Melngailis

doi:10.1063/1.1509113

Rapid imaging of nanotubes on insulating substrates

T. Brintlinger, Yung Fu Chen, T. Dürkop, Enrique Cobas, M. S. Fuhrer, John D. Barry, John Melngailis

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109 Citations (Scopus)

Abstract

We demonstrate the use of field-emission scanning electron microscopy for rapid imaging of small-diameter carbon nanotubes on insulating SiO₂ substrates. The image contrast stems from local potential differences between the nanotube and substrate and is insensitive to surface roughness and defects. This technique may also be used as a probe of the electrical connectivity of small structures without external leads.

Original language	English
Pages (from-to)	2454-2456
Number of pages	3
Journal	Applied Physics Letters
Volume	81
Issue number	13
DOIs	https://doi.org/10.1063/1.1509113
Publication status	Published - 23 Sept 2002
Externally published	Yes

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10.1063/1.1509113

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title = "Rapid imaging of nanotubes on insulating substrates",

abstract = "We demonstrate the use of field-emission scanning electron microscopy for rapid imaging of small-diameter carbon nanotubes on insulating SiO2 substrates. The image contrast stems from local potential differences between the nanotube and substrate and is insensitive to surface roughness and defects. This technique may also be used as a probe of the electrical connectivity of small structures without external leads.",

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AU - Dürkop, T.

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AU - Fuhrer, M. S.

AU - Barry, John D.

AU - Melngailis, John

PY - 2002/9/23

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N2 - We demonstrate the use of field-emission scanning electron microscopy for rapid imaging of small-diameter carbon nanotubes on insulating SiO2 substrates. The image contrast stems from local potential differences between the nanotube and substrate and is insensitive to surface roughness and defects. This technique may also be used as a probe of the electrical connectivity of small structures without external leads.

AB - We demonstrate the use of field-emission scanning electron microscopy for rapid imaging of small-diameter carbon nanotubes on insulating SiO2 substrates. The image contrast stems from local potential differences between the nanotube and substrate and is insensitive to surface roughness and defects. This technique may also be used as a probe of the electrical connectivity of small structures without external leads.

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Rapid imaging of nanotubes on insulating substrates

Abstract

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