Radiation hardness study for the COMET Phase-I electronics

Yu Nakazawa, Yuki Fujii, Ewen Gillies, Eitaro Hamada, Youichi Igarashi, Myeong Jae Lee, Manabu Moritsu, Yugo Matsuda, Yuta Miyazaki, Yuki Nakai, Hiroaki Natori, Kou Oishi, Akira Sato, Yoshi Uchida, Kazuki Ueno, Hiroshi Yamaguchi, Beom Ki Yeo, Hisataka Yoshida, Jie Zhang

Research output: Contribution to journalArticleResearchpeer-review

Abstract

Radiation damage on front-end readout and trigger electronics is an important issue in the COMET Phase-I experiment at J-PARC, which plans to search for the neutrinoless transition of a muon to an electron. To produce an intense muon beam, a high-power proton beam impinges on a graphite target, resulting in a high-radiation environment. We require radiation tolerance to a total dose of 1.0kGy and 1MeV equivalent neutron fluence of 1.0×1012neqcm−2 including a safety factor of 5 over the duration of the physics measurement. The use of commercially-available electronics components which have high radiation tolerance, if such components can be secured, is desirable in such an environment. The radiation hardness of commercial electronic components has been evaluated in gamma-ray and neutron irradiation tests. As results of these tests, voltage regulators, ADCs, DACs, and several other components were found to have enough tolerance to both gamma-ray and neutron irradiation at the level we require.

Original languageEnglish
Article number163247
Number of pages7
JournalNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment
Volume955
DOIs
Publication statusPublished - 1 Mar 2020

Keywords

  • ADC
  • DAC
  • Radiation tolerance
  • Voltage regulator

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