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Quantum transport in ultra-scaled phosphorous-doped silicon nanowires

  • Hoon Ryu
  • , S. Lee
  • , B. Weber
  • , S Mahapatra
  • , M. Y. Simmons
  • , Lloyd C L Hollenberg
  • , Gerhard Klimeck

    Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

    Abstract

    Highly phosphorous-doped nanowires in silicon (Si:P NW) represent the ultimate nanowire scaling limit of 1 atom thickness and a few atoms width. Experimental data are compared to an atomistic full-band model. Charge-potential self-consistency is computed by solving the exchange-correlation LDA corrected Schrödinger-Poisson equation. Transport through donor bands is observed in [110] Si:P NW at low temperature. The semi-metallic conductance computed in the ballistic regime agrees well with the experiment. Sensitivity of the NW properties on doping constant and placement disorder on the channel is addressed. The modeling confirms that the nanowires are semi-metallic and transport can be gate modulated.

    Original languageEnglish
    Title of host publication2010 Silicon Nanoelectronics Workshop, SNW 2010
    DOIs
    Publication statusPublished - 2010
    Event2010 15th Silicon Nanoelectronics Workshop, SNW 2010 - Honolulu, HI, United States of America
    Duration: 13 Jun 201014 Jun 2010

    Conference

    Conference2010 15th Silicon Nanoelectronics Workshop, SNW 2010
    Country/TerritoryUnited States of America
    CityHonolulu, HI
    Period13/06/1014/06/10

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