Quantitative transmission electron microscopy at atomic resolution

Leslie J Allen, Adrian J D'Alfonso, B D Forbes, Scott Findlay, J M LeBeau, Susanne Stemmer

    Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

    2 Citations (Scopus)
    Original languageEnglish
    Title of host publicationElectron Microscopy and Analysis Group Conference 2011, EMAG 2011
    EditorsG Moebus, T Walther, R Brydson, D Ozkaya, I MacLaren, S Donnelly, P Nellist, Z Li, R Baker, Y Chiu
    Place of PublicationBristol UK
    PublisherIOP Publishing
    Pages1 - 4
    Number of pages4
    Volume371
    ISBN (Print)1742-6588
    DOIs
    Publication statusPublished - 2012
    EventInstitute-of-Physics-Electron-Microscopy and Analysis-Group Conference (EMAG) 2011 - The University of Birmingham, Birmingham, United Kingdom
    Duration: 6 Sep 20119 Sep 2011
    https://www.eventsforce.net/iop/frontend/reg/thome.csp?pageID=48034&ef_sel_menu=740&eventID=142&eventID=142

    Conference

    ConferenceInstitute-of-Physics-Electron-Microscopy and Analysis-Group Conference (EMAG) 2011
    Abbreviated titleEMAG 2011
    CountryUnited Kingdom
    CityBirmingham
    Period6/09/119/09/11
    Internet address

    Cite this

    Allen, L. J., D'Alfonso, A. J., Forbes, B. D., Findlay, S., LeBeau, J. M., & Stemmer, S. (2012). Quantitative transmission electron microscopy at atomic resolution. In G. Moebus, T. Walther, R. Brydson, D. Ozkaya, I. MacLaren, S. Donnelly, P. Nellist, Z. Li, R. Baker, ... Y. Chiu (Eds.), Electron Microscopy and Analysis Group Conference 2011, EMAG 2011 (Vol. 371, pp. 1 - 4). Bristol UK: IOP Publishing. https://doi.org/10.1088/1742-6596/371/1/012009
    Allen, Leslie J ; D'Alfonso, Adrian J ; Forbes, B D ; Findlay, Scott ; LeBeau, J M ; Stemmer, Susanne. / Quantitative transmission electron microscopy at atomic resolution. Electron Microscopy and Analysis Group Conference 2011, EMAG 2011. editor / G Moebus ; T Walther ; R Brydson ; D Ozkaya ; I MacLaren ; S Donnelly ; P Nellist ; Z Li ; R Baker ; Y Chiu. Vol. 371 Bristol UK : IOP Publishing, 2012. pp. 1 - 4
    @inproceedings{d7c8c372f3b641c58866f9779912536b,
    title = "Quantitative transmission electron microscopy at atomic resolution",
    author = "Allen, {Leslie J} and D'Alfonso, {Adrian J} and Forbes, {B D} and Scott Findlay and LeBeau, {J M} and Susanne Stemmer",
    year = "2012",
    doi = "10.1088/1742-6596/371/1/012009",
    language = "English",
    isbn = "1742-6588",
    volume = "371",
    pages = "1 -- 4",
    editor = "G Moebus and T Walther and R Brydson and D Ozkaya and I MacLaren and S Donnelly and P Nellist and Z Li and R Baker and Y Chiu",
    booktitle = "Electron Microscopy and Analysis Group Conference 2011, EMAG 2011",
    publisher = "IOP Publishing",
    address = "United Kingdom",

    }

    Allen, LJ, D'Alfonso, AJ, Forbes, BD, Findlay, S, LeBeau, JM & Stemmer, S 2012, Quantitative transmission electron microscopy at atomic resolution. in G Moebus, T Walther, R Brydson, D Ozkaya, I MacLaren, S Donnelly, P Nellist, Z Li, R Baker & Y Chiu (eds), Electron Microscopy and Analysis Group Conference 2011, EMAG 2011. vol. 371, IOP Publishing, Bristol UK, pp. 1 - 4, Institute-of-Physics-Electron-Microscopy and Analysis-Group Conference (EMAG) 2011, Birmingham, United Kingdom, 6/09/11. https://doi.org/10.1088/1742-6596/371/1/012009

    Quantitative transmission electron microscopy at atomic resolution. / Allen, Leslie J; D'Alfonso, Adrian J; Forbes, B D; Findlay, Scott; LeBeau, J M; Stemmer, Susanne.

    Electron Microscopy and Analysis Group Conference 2011, EMAG 2011. ed. / G Moebus; T Walther; R Brydson; D Ozkaya; I MacLaren; S Donnelly; P Nellist; Z Li; R Baker; Y Chiu. Vol. 371 Bristol UK : IOP Publishing, 2012. p. 1 - 4.

    Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

    TY - GEN

    T1 - Quantitative transmission electron microscopy at atomic resolution

    AU - Allen, Leslie J

    AU - D'Alfonso, Adrian J

    AU - Forbes, B D

    AU - Findlay, Scott

    AU - LeBeau, J M

    AU - Stemmer, Susanne

    PY - 2012

    Y1 - 2012

    U2 - 10.1088/1742-6596/371/1/012009

    DO - 10.1088/1742-6596/371/1/012009

    M3 - Conference Paper

    SN - 1742-6588

    VL - 371

    SP - 1

    EP - 4

    BT - Electron Microscopy and Analysis Group Conference 2011, EMAG 2011

    A2 - Moebus, G

    A2 - Walther, T

    A2 - Brydson, R

    A2 - Ozkaya, D

    A2 - MacLaren, I

    A2 - Donnelly, S

    A2 - Nellist, P

    A2 - Li, Z

    A2 - Baker, R

    A2 - Chiu, Y

    PB - IOP Publishing

    CY - Bristol UK

    ER -

    Allen LJ, D'Alfonso AJ, Forbes BD, Findlay S, LeBeau JM, Stemmer S. Quantitative transmission electron microscopy at atomic resolution. In Moebus G, Walther T, Brydson R, Ozkaya D, MacLaren I, Donnelly S, Nellist P, Li Z, Baker R, Chiu Y, editors, Electron Microscopy and Analysis Group Conference 2011, EMAG 2011. Vol. 371. Bristol UK: IOP Publishing. 2012. p. 1 - 4 https://doi.org/10.1088/1742-6596/371/1/012009