Quantitative transmission electron microscopy at atomic resolution

Leslie J Allen; Adrian J D'Alfonso; B D Forbes; Scott Findlay; J M LeBeau; Susanne Stemmer

doi:10.1088/1742-6596/371/1/012009

Quantitative transmission electron microscopy at atomic resolution

Leslie J Allen, Adrian J D'Alfonso, B D Forbes, Scott Findlay, J M LeBeau, Susanne Stemmer

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

Original language	English
Title of host publication	Electron Microscopy and Analysis Group Conference 2011, EMAG 2011
Editors	G Moebus, T Walther, R Brydson, D Ozkaya, I MacLaren, S Donnelly, P Nellist, Z Li, R Baker, Y Chiu
Place of Publication	Bristol UK
Publisher	IOP Publishing
Pages	1 - 4
Number of pages	4
Volume	371
ISBN (Print)	1742-6588
DOIs	https://doi.org/10.1088/1742-6596/371/1/012009
Publication status	Published - 2012
Event	Institute-of-Physics-Electron-Microscopy and Analysis-Group Conference (EMAG) 2011 - The University of Birmingham, Birmingham, United Kingdom Duration: 6 Sept 2011 → 9 Sept 2011 https://www.eventsforce.net/iop/frontend/reg/thome.csp?pageID=48034&ef_sel_menu=740&eventID=142&eventID=142

Conference

Conference	Institute-of-Physics-Electron-Microscopy and Analysis-Group Conference (EMAG) 2011
Abbreviated title	EMAG 2011
Country/Territory	United Kingdom
City	Birmingham
Period	6/09/11 → 9/09/11
Internet address	https://www.eventsforce.net/iop/frontend/reg/thome.csp?pageID=48034&ef_sel_menu=740&eventID=142&eventID=142

Access to Document

10.1088/1742-6596/371/1/012009

Cite this

Allen, L. J., D'Alfonso, A. J., Forbes, B. D., Findlay, S., LeBeau, J. M., & Stemmer, S. (2012). Quantitative transmission electron microscopy at atomic resolution. In G. Moebus, T. Walther, R. Brydson, D. Ozkaya, I. MacLaren, S. Donnelly, P. Nellist, Z. Li, R. Baker, & Y. Chiu (Eds.), Electron Microscopy and Analysis Group Conference 2011, EMAG 2011 (Vol. 371, pp. 1 - 4). IOP Publishing. https://doi.org/10.1088/1742-6596/371/1/012009

@inproceedings{d7c8c372f3b641c58866f9779912536b,

title = "Quantitative transmission electron microscopy at atomic resolution",

author = "Allen, {Leslie J} and D'Alfonso, {Adrian J} and Forbes, {B D} and Scott Findlay and LeBeau, {J M} and Susanne Stemmer",

year = "2012",

doi = "10.1088/1742-6596/371/1/012009",

language = "English",

isbn = "1742-6588",

volume = "371",

pages = "1 -- 4",

editor = "G Moebus and T Walther and R Brydson and D Ozkaya and I MacLaren and S Donnelly and P Nellist and Z Li and R Baker and Y Chiu",

booktitle = "Electron Microscopy and Analysis Group Conference 2011, EMAG 2011",

publisher = "IOP Publishing",

address = "United Kingdom",

note = "Institute-of-Physics-Electron-Microscopy and Analysis-Group Conference (EMAG) 2011, EMAG 2011 ; Conference date: 06-09-2011 Through 09-09-2011",

url = "https://www.eventsforce.net/iop/frontend/reg/thome.csp?pageID=48034&ef_sel_menu=740&eventID=142&eventID=142",

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Allen, LJ, D'Alfonso, AJ, Forbes, BD, Findlay, S, LeBeau, JM & Stemmer, S 2012, Quantitative transmission electron microscopy at atomic resolution. in G Moebus, T Walther, R Brydson, D Ozkaya, I MacLaren, S Donnelly, P Nellist, Z Li, R Baker & Y Chiu (eds), Electron Microscopy and Analysis Group Conference 2011, EMAG 2011. vol. 371, IOP Publishing, Bristol UK, pp. 1 - 4, Institute-of-Physics-Electron-Microscopy and Analysis-Group Conference (EMAG) 2011, Birmingham, United Kingdom, 6/09/11. https://doi.org/10.1088/1742-6596/371/1/012009

Quantitative transmission electron microscopy at atomic resolution. / Allen, Leslie J; D'Alfonso, Adrian J; Forbes, B D et al.
Electron Microscopy and Analysis Group Conference 2011, EMAG 2011. ed. / G Moebus; T Walther; R Brydson; D Ozkaya; I MacLaren; S Donnelly; P Nellist; Z Li; R Baker; Y Chiu. Vol. 371 Bristol UK: IOP Publishing, 2012. p. 1 - 4.

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

TY - GEN

T1 - Quantitative transmission electron microscopy at atomic resolution

AU - Allen, Leslie J

AU - D'Alfonso, Adrian J

AU - Forbes, B D

AU - Findlay, Scott

AU - LeBeau, J M

AU - Stemmer, Susanne

PY - 2012

Y1 - 2012

U2 - 10.1088/1742-6596/371/1/012009

DO - 10.1088/1742-6596/371/1/012009

M3 - Conference Paper

SN - 1742-6588

VL - 371

SP - 1

EP - 4

BT - Electron Microscopy and Analysis Group Conference 2011, EMAG 2011

A2 - Moebus, G

A2 - Walther, T

A2 - Brydson, R

A2 - Ozkaya, D

A2 - MacLaren, I

A2 - Donnelly, S

A2 - Nellist, P

A2 - Li, Z

A2 - Baker, R

A2 - Chiu, Y

PB - IOP Publishing

CY - Bristol UK

T2 - Institute-of-Physics-Electron-Microscopy and Analysis-Group Conference (EMAG) 2011

Y2 - 6 September 2011 through 9 September 2011

ER -

Allen LJ, D'Alfonso AJ, Forbes BD, Findlay S, LeBeau JM, Stemmer S. Quantitative transmission electron microscopy at atomic resolution. In Moebus G, Walther T, Brydson R, Ozkaya D, MacLaren I, Donnelly S, Nellist P, Li Z, Baker R, Chiu Y, editors, Electron Microscopy and Analysis Group Conference 2011, EMAG 2011. Vol. 371. Bristol UK: IOP Publishing. 2012. p. 1 - 4 doi: 10.1088/1742-6596/371/1/012009