A method is described that reconstructs the projected object potential using data recorded in the coherent imaging mode of a scanning transmission electron microscope. The technique is applicable in the presence of multiple scattering. It is not required that the thickness is known. Model examples exploring the nature of the data set required, the stability of the algorithm and the limitations on resolution are provided.
|Pages (from-to)||397 - 404|
|Number of pages||8|
|Journal||Acta Crystallographica Section A: Foundations of Crystallography|
|Publication status||Published - 2005|