Quantitative structure retrieval using scanning transmission electron microscopy

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Abstract

A method is described that reconstructs the projected object potential using data recorded in the coherent imaging mode of a scanning transmission electron microscope. The technique is applicable in the presence of multiple scattering. It is not required that the thickness is known. Model examples exploring the nature of the data set required, the stability of the algorithm and the limitations on resolution are provided.
Original languageEnglish
Pages (from-to)397 - 404
Number of pages8
JournalActa Crystallographica Section A: Foundations of Crystallography
Volume61
Issue number4
DOIs
Publication statusPublished - 2005
Externally publishedYes

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