Quantitative STEM imaging of order-disorder phenomena in double perovskite thin films

B. D. Esser; A. J. Hauser; R. E. A. Williams; L. J. Allen; P. M. Woodward; F. Y. Yang; D. W. McComb

doi:10.1103/PhysRevLett.117.176101

Quantitative STEM imaging of order-disorder phenomena in double perovskite thin films

B. D. Esser, A. J. Hauser, R. E. A. Williams, L. J. Allen, P. M. Woodward, F. Y. Yang, D. W. McComb

Research output: Contribution to journal › Article › Research › peer-review

14 Citations (Scopus)

Abstract

Using aberration-corrected high-angle annular dark field scanning transmission electron microscopy (HAADF-STEM), we investigate ordering phenomena in epitaxial thin films of the double perovskite Sr2CrReO6. Experimental and simulated imaging and diffraction are used to identify antiphase domains in the films. Image simulation provides insight into the effects of atomic-scale ordering along the beam direction on HAADF-STEM intensity. We show that probe channeling results in ±20% variation in intensity for a given composition, allowing 3D ordering information to be probed using quantitative STEM.

Original language	English
Article number	176101
Number of pages	5
Journal	Physical Review Letters
Volume	117
Issue number	17
DOIs	https://doi.org/10.1103/PhysRevLett.117.176101
Publication status	Published - 20 Oct 2016
Externally published	Yes

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10.1103/PhysRevLett.117.176101

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Cite this

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title = "Quantitative STEM imaging of order-disorder phenomena in double perovskite thin films",

abstract = "Using aberration-corrected high-angle annular dark field scanning transmission electron microscopy (HAADF-STEM), we investigate ordering phenomena in epitaxial thin films of the double perovskite Sr2CrReO6. Experimental and simulated imaging and diffraction are used to identify antiphase domains in the films. Image simulation provides insight into the effects of atomic-scale ordering along the beam direction on HAADF-STEM intensity. We show that probe channeling results in ±20% variation in intensity for a given composition, allowing 3D ordering information to be probed using quantitative STEM.",

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AU - Esser, B. D.

AU - Hauser, A. J.

AU - Williams, R. E. A.

AU - Allen, L. J.

AU - Woodward, P. M.

AU - Yang, F. Y.

AU - McComb, D. W.

PY - 2016/10/20

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N2 - Using aberration-corrected high-angle annular dark field scanning transmission electron microscopy (HAADF-STEM), we investigate ordering phenomena in epitaxial thin films of the double perovskite Sr2CrReO6. Experimental and simulated imaging and diffraction are used to identify antiphase domains in the films. Image simulation provides insight into the effects of atomic-scale ordering along the beam direction on HAADF-STEM intensity. We show that probe channeling results in ±20% variation in intensity for a given composition, allowing 3D ordering information to be probed using quantitative STEM.

AB - Using aberration-corrected high-angle annular dark field scanning transmission electron microscopy (HAADF-STEM), we investigate ordering phenomena in epitaxial thin films of the double perovskite Sr2CrReO6. Experimental and simulated imaging and diffraction are used to identify antiphase domains in the films. Image simulation provides insight into the effects of atomic-scale ordering along the beam direction on HAADF-STEM intensity. We show that probe channeling results in ±20% variation in intensity for a given composition, allowing 3D ordering information to be probed using quantitative STEM.

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