Quantitative STEM imaging of order-disorder phenomena in double perovskite thin films

B. D. Esser, A. J. Hauser, R. E. A. Williams, L. J. Allen, P. M. Woodward, F. Y. Yang, D. W. McComb

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14 Citations (Scopus)

Abstract

Using aberration-corrected high-angle annular dark field scanning transmission electron microscopy (HAADF-STEM), we investigate ordering phenomena in epitaxial thin films of the double perovskite Sr2CrReO6. Experimental and simulated imaging and diffraction are used to identify antiphase domains in the films. Image simulation provides insight into the effects of atomic-scale ordering along the beam direction on HAADF-STEM intensity. We show that probe channeling results in ±20% variation in intensity for a given composition, allowing 3D ordering information to be probed using quantitative STEM.

Original languageEnglish
Article number176101
Number of pages5
JournalPhysical Review Letters
Volume117
Issue number17
DOIs
Publication statusPublished - 20 Oct 2016
Externally publishedYes

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