Abstract
Using aberration-corrected high-angle annular dark field scanning transmission electron microscopy (HAADF-STEM), we investigate ordering phenomena in epitaxial thin films of the double perovskite Sr2CrReO6. Experimental and simulated imaging and diffraction are used to identify antiphase domains in the films. Image simulation provides insight into the effects of atomic-scale ordering along the beam direction on HAADF-STEM intensity. We show that probe channeling results in ±20% variation in intensity for a given composition, allowing 3D ordering information to be probed using quantitative STEM.
Original language | English |
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Article number | 176101 |
Number of pages | 5 |
Journal | Physical Review Letters |
Volume | 117 |
Issue number | 17 |
DOIs | |
Publication status | Published - 20 Oct 2016 |
Externally published | Yes |