Quantitative statistical analysis, optimization and noise reduction of atomic resolved electron energy loss spectrum images

Karleen Dudeck; Martin Couillard; Sorin Lazar; Christian Dwyer; Gianluigi A Botton

doi:10.1016/j.micron.2011.07.008

Quantitative statistical analysis, optimization and noise reduction of atomic resolved electron energy loss spectrum images

Karleen Dudeck, Martin Couillard, Sorin Lazar, Christian Dwyer, Gianluigi A Botton

Materials Science & Engineering

Research output: Contribution to journal › Article › Research › peer-review

15 Citations (Scopus)

Original language	English
Pages (from-to)	57 - 67
Number of pages	11
Journal	Micron
Volume	43
Issue number	1
DOIs	https://doi.org/10.1016/j.micron.2011.07.008
Publication status	Published - 2012

Access to Document

10.1016/j.micron.2011.07.008

Cite this

@article{b2cd6132489e4e74863f2d99704c6550,

title = "Quantitative statistical analysis, optimization and noise reduction of atomic resolved electron energy loss spectrum images",

author = "Karleen Dudeck and Martin Couillard and Sorin Lazar and Christian Dwyer and Botton, {Gianluigi A}",

year = "2012",

doi = "10.1016/j.micron.2011.07.008",

language = "English",

volume = "43",

pages = "57 -- 67",

journal = "Micron",

issn = "0968-4328",

publisher = "Elsevier",

number = "1",

}

TY - JOUR

T1 - Quantitative statistical analysis, optimization and noise reduction of atomic resolved electron energy loss spectrum images

AU - Dudeck, Karleen

AU - Couillard, Martin

AU - Lazar, Sorin

AU - Dwyer, Christian

AU - Botton, Gianluigi A

PY - 2012

Y1 - 2012

UR - http://dx.doi.org/10.1016/j.micron.2011.07.008

U2 - 10.1016/j.micron.2011.07.008

DO - 10.1016/j.micron.2011.07.008

M3 - Article

SN - 0968-4328

VL - 43

SP - 57

EP - 67

JO - Micron

JF - Micron

IS - 1

ER -

Quantitative statistical analysis, optimization and noise reduction of atomic resolved electron energy loss spectrum images

Access to Document

Other files and links

Centre for Electron Microscopy (MCEM)

Cite this

Quantitative statistical analysis, optimization and noise reduction of atomic resolved electron energy loss spectrum images

Access to Document

Other files and links

Equipment

Centre for Electron Microscopy (MCEM)

Cite this