Quantitative phase retrieval with picosecond X-ray pulses from the ATF inverse compton scattering source

M. Endrizzi, T. E. Gureyev, P. Delogu, Paola Oliva-Altamirano, B. Golosio, M. Carpinelli, I. Pogorelsky, V. Yakimenko, Ubaldo Bottigli

Research output: Contribution to journalArticleResearchpeer-review

7 Citations (Scopus)

Abstract

Quantitative phase retrieval is experimentally demonstrated using the Inverse Compton Scattering X-ray source available at the Accelerator Test Facility (ATF) in the Brookhaven National Laboratory. Phase-contrast images are collected using in-line geometry, with a single X-ray pulse of approximate duration of one picosecond. The projected thickness of homogeneous samples of various polymers is recovered quantitatively from the time-averaged intensity of transmitted X-rays. The data are in good agreement with the expectations showing that ATF Inverse Compton Scattering source is suitable for performing phase-sensitive quantitative X-ray imaging on the picosecond scale. The method shows promise for quantitative imaging of fast dynamic phenomena.

Original languageEnglish
Pages (from-to)2748-2753
Number of pages6
JournalOptics Express
Volume19
Issue number3
DOIs
Publication statusPublished - 31 Jan 2011
Externally publishedYes

Cite this

Endrizzi, M., Gureyev, T. E., Delogu, P., Oliva-Altamirano, P., Golosio, B., Carpinelli, M., Pogorelsky, I., Yakimenko, V., & Bottigli, U. (2011). Quantitative phase retrieval with picosecond X-ray pulses from the ATF inverse compton scattering source. Optics Express, 19(3), 2748-2753. https://doi.org/10.1364/OE.19.002748