Abstract
Precipitates in an Al-Mg-Ge alloy similar to the ? phase in Al-Mg-Si alloys were investigated using quantitative aberration-corrected high-angle annular dark-field scanning transmission electron microscopy (HAADF STEM). Quantitative investigation into the Ge-rich columns of the precipitates found the intensity of these columns to be consistent with an Al concentration of 30?10 , or a vacancy concentration of 20?10 . Possible errors involved in the determination of the column composition are discussed.
Original language | English |
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Title of host publication | Institute-of-Physics-Electron-Microscopy and Analysis-Group Conference (EMAG) 2011 |
Editors | P Nellist, I MacLaren |
Place of Publication | Bristol UK |
Publisher | IOP Publishing |
Pages | 1 - 4 |
Number of pages | 4 |
DOIs | |
Publication status | Published - 2012 |
Event | Institute-of-Physics-Electron-Microscopy and Analysis-Group Conference (EMAG) 2011 - The University of Birmingham, Birmingham, United Kingdom Duration: 6 Sept 2011 → 9 Sept 2011 https://www.eventsforce.net/iop/frontend/reg/thome.csp?pageID=48034&ef_sel_menu=740&eventID=142&eventID=142 |
Publication series
Name | Journal of Physics: Conference Series |
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Publisher | IOP Publishing |
Volume | 371 |
ISSN (Print) | 1742-6588 |
ISSN (Electronic) | 1742-6596 |
Conference
Conference | Institute-of-Physics-Electron-Microscopy and Analysis-Group Conference (EMAG) 2011 |
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Abbreviated title | EMAG 2011 |
Country/Territory | United Kingdom |
City | Birmingham |
Period | 6/09/11 → 9/09/11 |
Internet address |
Equipment
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Centre for Electron Microscopy (MCEM)
Sorrell, F. (Manager) & Miller, P. (Manager)
Office of the Vice-Provost (Research and Research Infrastructure)Facility/equipment: Facility