Quantitative electric field mapping in thin specimens using a segmented detector

Revisiting the transfer function for differential phase contrast

Takehito Seki, Gabriel Sánchez-Santolino, Ryo Ishikawa, Scott D Findlay, Yuichi Ikuhara, Naoya Shibata

Research output: Contribution to journalArticleResearchpeer-review

8 Citations (Scopus)

Abstract

Differential phase contrast in scanning transmission electron microscopy can visualize local electromagnetic fields inside specimens. The contrast derived from first moments, the so-called center of mass, of the diffraction patterns for each probe position can be quantitatively related to the local electromagnetic field under the phase object approximation. While only approximate first moments can be obtained with a segmented detector, in weak phase objects the fields can be accurately quantified on the basis of a phase contrast transfer function. Through systematic image simulations we further show that the quantification based on the approximated first moment is a good approximation also for strong phase objects.

Original languageEnglish
Pages (from-to)258-263
Number of pages6
JournalUltramicroscopy
Volume182
DOIs
Publication statusPublished - 1 Nov 2017

Cite this

Seki, Takehito ; Sánchez-Santolino, Gabriel ; Ishikawa, Ryo ; Findlay, Scott D ; Ikuhara, Yuichi ; Shibata, Naoya. / Quantitative electric field mapping in thin specimens using a segmented detector : Revisiting the transfer function for differential phase contrast. In: Ultramicroscopy. 2017 ; Vol. 182. pp. 258-263.
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Quantitative electric field mapping in thin specimens using a segmented detector : Revisiting the transfer function for differential phase contrast. / Seki, Takehito; Sánchez-Santolino, Gabriel; Ishikawa, Ryo; Findlay, Scott D; Ikuhara, Yuichi; Shibata, Naoya.

In: Ultramicroscopy, Vol. 182, 01.11.2017, p. 258-263.

Research output: Contribution to journalArticleResearchpeer-review

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