Quantitative atomic resolution elemental mapping via absolute-scale energy dispersive X-ray spectroscopy

Z Chen, M Weyland, X Sang, W Xu, J H Dycus, J M LeBeau, A J D'Alfonso, L J Allen, S D Findlay

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28 Citations (Scopus)

Abstract

Quantitative agreement on an absolute scale is demonstrated between experiment and simulation for two-dimensional, atomic-resolution elemental mapping via energy dispersive X-ray spectroscopy. This requires all experimental parameters to be carefully characterized. The agreement is good, but some discrepancies remain. The most likely contributing factors are identified and discussed. Previous predictions that increasing the probe forming aperture helps to suppress the channelling enhancement in the average signal are confirmed experimentally. It is emphasized that simple column-by-column analysis requires a choice of sample thickness that compromises between being thick enough to yield a good signal-to-noise ratio while being thin enough that the overwhelming majority of the EDX signal derives from the column on which the probe is placed, despite strong electron scattering effects.
Original languageEnglish
Pages (from-to)7-16
Number of pages10
JournalUltramicroscopy
Volume168
DOIs
Publication statusPublished - 2016

Keywords

  • Atomic-resolution mapping
  • Elemental quantification
  • Energy dispersive X-ray (EDX) spectroscopy
  • Scanning transmission electron microscopy (STEM)

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