Quantifying image distortions using SVD

Chong Yaw Wee, Xudong Jiang, Alex C. Kot, Raveendran Paramesran

Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

3 Citations (Scopus)

Abstract

This paper describes a novel, yet effective model for automatically evaluating or quantifying the visual quality of a distorted image against its reference, based on the image statistical information. Image statistical information is embedded into the proposed model via a set of singular values, extracted using SVD, each of which characterizes the dynamics of image energy. Alterations of singular values (image energy) provide an effective indicator to quantify the degradation of image quality subjected to a wide variety of distortions. The proposed metric assesses image quality locally as well as globally and provides two different measures as outputs, i.e., graphical and numerical measures. The graphical measure, referred as distortion map, describes on how the image is deviated from its reference, through the local distribution of distortion over the whole image domain. The numerical measure is a scalar value obtained from the distortion map, which quantifies the global quality of distorted image. The proposed metric has been used to quantify the quality of natural images of various distortion types from LIVE image database, and experimental results shown justify the effectiveness and reliability of the proposed metric over the exiting SVD-based metrics.

Original languageEnglish
Title of host publicationProceedings of the 2010 5th IEEE Conference on Industrial Electronics and Applications, ICIEA 2010
PublisherIEEE, Institute of Electrical and Electronics Engineers
Pages381-386
Number of pages6
ISBN (Print)9781424450466
DOIs
Publication statusPublished - 2010
Externally publishedYes
EventIEEE Conference on Industrial Electronics and Applications 2010 - Taichung, Taiwan
Duration: 15 Jun 201017 Jun 2010
Conference number: 5th
http://ieeeiciea.org/2010/index.html

Conference

ConferenceIEEE Conference on Industrial Electronics and Applications 2010
Abbreviated titleICIEA 2010
Country/TerritoryTaiwan
CityTaichung
Period15/06/1017/06/10
Internet address

Keywords

  • Global quality score
  • Image energy
  • Image quality assessment
  • Local distortion map
  • Singular value decomposition (SVD)
  • Statistical information

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