Progressive damage detection/diagnosis on composite using electromechanical impedance spectroscopy

Lingyu Yu, Patrick Pollock, Matthieu Gresil, Michael Sutton

Research output: Chapter in Book/Report/Conference proceedingConference PaperOther

5 Citations (Scopus)

Abstract

Electromechanical impedance approach infers the structural dynamic characteristics at relatively high frequencies by using self-sensing piezoelectric wafer elements. Structural damage can be detected by comparing structural dynamic responses of damaged and undamaged structures. This paper presents an ongoing effort using piezoelectric wafer sensors to measure structural electro-mechanical impedance response under tensile loading and quantitatively correlate the measurements with damage progression. The purpose is not only to develop a better understanding of the damage progression in composite materials, but also to establish a relationship between electromechanical impedance measurements with local material damage progression. Multi-physics finite element codes are used to simulate the electromechanical resonance of a free piezoelectric wafer sensor to better understand the effect of electromechanical transduction. The effects on impedance measurement from bonding layer degradation and PWAS degradation are also studied. Our study confirms that the EMI changes are related to very small amount material or structural changes, indicating that electromechanical impedance spectroscopy offers a potential for detection of the progression of small damage at the material level.

Original languageEnglish
Title of host publicationASME 2011 International Mechanical Engineering Congress and Exposition, IMECE 2011
Pages255-262
Number of pages8
Publication statusPublished - 1 Dec 2011
Externally publishedYes
EventInternational Mechanical Engineering Congress and Exposition 2011 - Denver, United States of America
Duration: 11 Nov 201117 Nov 2011

Publication series

NameASME 2011 International Mechanical Engineering Congress and Exposition, IMECE 2011
Volume1

Conference

ConferenceInternational Mechanical Engineering Congress and Exposition 2011
Abbreviated titleIMECE 2011
Country/TerritoryUnited States of America
CityDenver
Period11/11/1117/11/11

Keywords

  • Composite
  • Electromechanical impedance
  • EMIS
  • Piezoelectric wafer active sensors
  • Structural health monitoring

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