Probing the Thermal Stability of OLEDs with Neutrons

Paul L. Burn, Jake A. McEwan, Andrew J. Clulow, Renjie Wang, Andrew Nelson, Ian R. Gentle

Research output: Chapter in Book/Report/Conference proceedingConference PaperOther

3 Citations (Scopus)

Abstract

Organic light-emitting diodes (OLEDs) are subjected to varying conditions of temperature during their lifetime. Using a combination of neutron reflectometry and in situ photoluminescence spectroscopy we show that layers typically found in OLEDs can interdiffuse. The diffusion is temperature dependent and it is found that the iridium(III) complexes can be remarkably mobile, even with relatively bulky alkyl groups attached to the ligand.

Original languageEnglish
Title of host publicationDigest of Technical Papers - SID International Symposium
PublisherJohn Wiley & Sons
Pages1129-1133
Number of pages5
Volume48
Edition1
DOIs
Publication statusPublished - May 2017
Externally publishedYes
EventSID Symposium, Seminar, and Exhibition 2017, Display Week 2017 - Los Angeles, United States of America
Duration: 21 May 201726 May 2017

Publication series

NameSID Symposium Digest of Technical Papers
PublisherJohn Wiley & Sons
ISSN (Print)0097-966X
ISSN (Electronic)2168-0159

Conference

ConferenceSID Symposium, Seminar, and Exhibition 2017, Display Week 2017
Country/TerritoryUnited States of America
CityLos Angeles
Period21/05/1726/05/17

Keywords

  • Diffusion
  • Neutron reflectometry
  • Organic light-emitting diode
  • Photoluminescence
  • Thermal stress

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