Predictive die-level reliability-yield modeling for deep sub-micron devices

Melanie Ooi, Ye Chow Kuang, Chris Chan, Serge Demidenko

Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

3 Citations (Scopus)
Original languageEnglish
Title of host publicationProceedings Fourth IEEE International Symposium on Electronic Design, Test and Applications DELTA 2008
EditorsAdam Osseiran, Michel Renovell, Abbes Amira, Kong Pang Pun, Lai Kan Lincoln Leung
Place of PublicationNew Jersey, US
PublisherIEEE, Institute of Electrical and Electronics Engineers
Pages216 - 221
Number of pages6
Volume0
ISBN (Print)9780769531106
Publication statusPublished - 2008
EventIEEE International Symposium on Electronic Design, Test and Applications (DELTA) 2008 - Hong Kong, China
Duration: 23 Jan 200825 Jan 2008
Conference number: 4th
https://ieeexplore.ieee.org/xpl/conhome/4459488/proceeding (Proceedings)

Conference

ConferenceIEEE International Symposium on Electronic Design, Test and Applications (DELTA) 2008
Abbreviated titleDELTA 2008
Country/TerritoryChina
CityHong Kong
Period23/01/0825/01/08
Internet address

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