@inproceedings{a24d21cf95654655be1ea53f5d953554,
title = "Predictive die-level reliability-yield modeling for deep sub-micron devices",
author = "Melanie Ooi and Kuang, {Ye Chow} and Chris Chan and Serge Demidenko",
year = "2008",
language = "English",
isbn = "9780769531106",
volume = "0",
pages = "216 -- 221",
editor = "Adam Osseiran and Michel Renovell and Abbes Amira and Pun, {Kong Pang} and Leung, {Lai Kan Lincoln}",
booktitle = "Proceedings Fourth IEEE International Symposium on Electronic Design, Test and Applications DELTA 2008",
publisher = "IEEE, Institute of Electrical and Electronics Engineers",
address = "United States of America",
note = "IEEE International Symposium on Electronic Design, Test and Applications (DELTA) 2008 ; Conference date: 01-01-2008",
}